IEEE P1581 can solve your board level memory cluster test problems

Ehrenberg, H.

doi:10.1109/test.2007.4437625

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“…If the read data differs from the previously written data, an error has been detected. The diagnostic detail that can be obtained depends on the set of data [2] [4].…”

Section: 1mentioning

confidence: 99%

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IEEE Std 1581 — A standardized test access methodology for memory devices

Ehrenberg¹,

Russell²

2011

2011 IEEE International Test Conference

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Memory devices have been becoming more complex with every generation and this trend is very likely to continue. Different kinds of memories present different challenges for board level test applications. In this paper we discuss several of those challenges and will introduce a new test technology standardized as IEEE Std 1581, offering an elegant solution to many problems related to the test of the board and system level connectivity at memory device pins.

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“…If the read data differs from the previously written data, an error has been detected. The diagnostic detail that can be obtained depends on the set of data [2] [4].…”

Section: 1mentioning

confidence: 99%

“…Memory devices have been becoming more complex with every generation and this trend is likely to continue. Different kinds of memories present different challenges for test applications beyond the IC level [4].…”

Section: Introductionmentioning

confidence: 99%