Identification of primitive faults in combinational and sequential circuits

Tekumalla, R.C.; Menon, P.R.

doi:10.1109/43.969436

Cited by 10 publications

(7 citation statements)

References 21 publications

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“…The biological layer defines a short range sensing volume within which the electromagnetic field may interact with the sensed medium that attenuates it by means of refractive index changes, absorption or scattering [18] [9]. Hence, the transmission of light through the waveguide can then be measured as a function of the attenuated field [20] [21].…”

Section: Modeling Of Parametersmentioning

confidence: 99%

“…There are well-established techniques for testing digital ICs [7][8] [9], also accurate measures of testability for such circuits [10] [11]. Techniques for testing analogue circuits were presented in [12][13] [14][15] [16] [17], where it was shown and extensively applied that simulation, sensitivity, and other numerical and analytical methods can help in both analogue design and in analogue circuit testing.…”

Section: Introductionmentioning

confidence: 99%

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Parameter Modelling Approach with Potential Applications for Self-Test of Biosensors

Kadim

2008

2008 NASA/ESA Conference on Adaptive Hardware and Systems

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Establishing a relationship between the measurand and key parameters affecting the propagated light in a waveguide provides useful information for functional verification and testing of optical biosensors. The proposed mathematical model can estimate the expected responses which -independent of the sensor operation -can be compared against the measured responses to identify inconsistencies in the sensor performance. A noticeable drift in the estimated light intensity from that measured at the detector is an indication of abnormality in the sensor's functionality.

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Section: Modeling Of Parametersmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Parameter Modelling Approach with Potential Applications for Self-Test of Biosensors

Kadim

2008

2008 NASA/ESA Conference on Adaptive Hardware and Systems

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“…When an error is latched at a flip-flop, possible error values at other flip-flops must be considered. Most existing robust and non-robust techniques for error propagation in sequential circuit [8,9] produce pessimistic results because they allow only one flip-flop to have an error during the propagation phase. The technique in [7] presents non-robust error propagation considering errors latched in other flip-flops.…”

Section: Introductionmentioning

confidence: 99%

Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures

Flanigan

Abdulrahman

Tragoudas

2008

9th International Symposium on Quality Electronic Design (Isqed 2008)

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A complete function-based scheme is presented to identify at-speed sequentially untestable path delay faults. We introduce signature variables to implicitly track error propagation through combinational and sequential circuits. The path sensitization test functions are encoded with the signature variables. These encoded test functions allow implicit identification of all propagating transitions corresponding to each individual test function minterm. We then utilize the signature variables during the fault propagation in a way such that the latched error propagates robustly to an observable point irrespective of other latched errors. Results presented on the ISCAS'89 benchmarks show a large number of sequentially untestable path delay faults are identified.

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“…There may also be faults Fi, Fj that satisfy condition (1) of Lemma 3. If Fi Fj, Fj must be deleted from the set of primitive It has been shown in [22] that all primitive faults in combinational circuits can be identified using Lemmas 2 and 3. …”

Section: Lemmamentioning

confidence: 99%