Identification of graphene crystallographic orientation by atomic force microscopy

Almeida, C. M.; Carôzo, Victor; Prioli, R.; Achete, Carlos A.

doi:10.1063/1.3642991

Cited by 21 publications

(22 citation statements)

References 21 publications

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“…The twist angle of TBG created by folding of a monolayer is conveniently estimated via sample geometry. Graphene flakes are predominantly terminated by straight edges oriented amongst each other in increments of

n \times 30

° (with n as an integer); said edges form along armchair‐ and zigzag‐directions in the lattice and may thus serve as indicator of crystallographic orientation. Due to the mirror symmetry around crystallographic axes in graphene the folded edge effectively reflects the original lattice onto the folded portion as illustrated in Fig .…”

Section: Preparation and Morphologymentioning

confidence: 99%

“…like electrical contacting in the case of STM measurements). Lattice resolution in graphene down to the atomic scale has been demonstrated even on rough

{SiO}_{2}

substrates and in ambient conditions; here, the lateral range of the scanner needs to be restricted to

\sim 1 μ

m however to forestall resonant piezo oscillations at the high scanning speeds necessary to preclude thermal smearing (40Hz in Ref. []).…”

Section: Preparation and Morphologymentioning

confidence: 99%

“…Lattice resolution in graphene down to the atomic scale has been demonstrated even on rough

{SiO}_{2}

substrates and in ambient conditions; here, the lateral range of the scanner needs to be restricted to

\sim 1 μ

m however to forestall resonant piezo oscillations at the high scanning speeds necessary to preclude thermal smearing (40Hz in Ref. []). TBG Moiré periods in the upper nm‐range may in contrast be resolved also at lower frequencies around 10Hz, allowing for a heavier and thus larger scanner type of around 100μm in lateral range (see also Ref.…”

Section: Preparation and Morphologymentioning

confidence: 99%

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Twisted Bilayer Graphene: Interlayer Configuration and Magnetotransport Signatures

Rode¹,

Смирнов²,

Belke³

et al. 2017

Annalen der Physik

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Twisted Bilayer Graphene may be viewed as very first representative of the now booming class of artificially layered 2D materials. Consisting of two sheets from the same structure and atomic composition, its decisive degree of freedom lies in the rotation between crystallographic axes in the individual graphene monolayers. Geometrical consideration finds angle-dependent Moiré patterns as well as commensurate superlattices of opposite sublattice exchange symmetry. Beyond the approach of rigidly interposed lattices, this review takes focus on the evolving topic of lattice corrugation and distortion in response to spatially varying lattice registry. The experimental approach to twisted bilayers requires a basic control over preparation techniques; important methods are summarized and extended on in the case of bilayers folded from monolayer graphene via AFM nanomachining. Central morphological parameters to the twisted bilayer, rotational mismatch and interlayer separation are studied in a broader base of samples. Finally, experimental evidence for a number of theoretically predicted, controversial electronic scenarios are reviewed; magnetotransport signatures are discussed in terms of Fermi velocity, van Hove singularities and Berry phase and assessed with respect to the underlying experimental conditions, thereby referring back to the initially considered variations in relaxed lattice structure.

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n \times 30

Section: Preparation and Morphologymentioning

confidence: 99%

“…like electrical contacting in the case of STM measurements). Lattice resolution in graphene down to the atomic scale has been demonstrated even on rough

{SiO}_{2}

substrates and in ambient conditions; here, the lateral range of the scanner needs to be restricted to

\sim 1 μ

m however to forestall resonant piezo oscillations at the high scanning speeds necessary to preclude thermal smearing (40Hz in Ref. []).…”

Section: Preparation and Morphologymentioning

confidence: 99%

“…Lattice resolution in graphene down to the atomic scale has been demonstrated even on rough

{SiO}_{2}

substrates and in ambient conditions; here, the lateral range of the scanner needs to be restricted to

\sim 1 μ

Section: Preparation and Morphologymentioning

confidence: 99%

See 1 more Smart Citation

Twisted Bilayer Graphene: Interlayer Configuration and Magnetotransport Signatures

Rode¹,

Смирнов²,

Belke³

et al. 2017

Annalen der Physik

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show abstract

“…Several techniques, such as atomic force microscopy (AFM), scanning tunneling microscopy (STM), transmission electron microscopy (TEM) and Raman spectroscopy, have been used to study the edge/crystal orientations and the stacking orders of graphene18192021222324252627282930. Among them, Raman spectroscopy with Raman mapping is the most favored due to its high spectral efficiency (tens of milliseconds integration time for a clear spectrum), non-destructiveness and lack of special sample preparation.…”

mentioning

confidence: 99%

Visualization of arrangements of carbon atoms in graphene layers by Raman mapping and atomic-resolution TEM

Cong

Zhang

et al. 2013

Sci Rep

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In-plane and out-of-plane arrangements of carbon atoms in graphene layers play critical roles in the fundamental physics and practical applications of these novel two-dimensional materials. Here, we report initial results on the edge/crystal orientations and stacking orders of bi- and tri-layer graphene (BLG and TLG) from Raman spectroscopy and transmission electron microscopy (TEM) experiments performed on the same sample. We introduce a new method of transferring graphene flakes onto a normal TEM grid. Using this novel method, we probed the BLG and TLG flakes that had been previously investigated by Raman scattering with high-resolution (atomic) TEM.

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“…The distances between peaks are in agreement with the lattice spacing of graphene. (d) A lattice resolution AFM image of a graphene with its optical image with the highlighted two edges I and I I [171]. (e) Selected-area electron diffraction pattern of graphene [38].…”

Section: Comparison With Other Techniquesmentioning

confidence: 99%

Basic Concepts and Recent Advances of Crystallographic Orientation Determination of Graphene by Raman Spectroscopy

et al. 2018

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Graphene is a kind of typical two-dimensional material consisting of pure carbon element. The unique material shows many interesting properties which are dependent on crystallographic orientations. Therefore, it is critical to determine their crystallographic orientations when their orientation-dependent properties are investigated. Raman spectroscopy has been developed recently to determine crystallographic orientations of two-dimensional materials and has become one of the most powerful tools to characterize graphene nondestructively. This paper summarizes basic aspects of Raman spectroscopy in crystallographic orientation of graphene nanosheets, determination principles, the determination methods, and the latest achievements in the related studies.

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Identification of graphene crystallographic orientation by atomic force microscopy

Cited by 21 publications

References 21 publications

Twisted Bilayer Graphene: Interlayer Configuration and Magnetotransport Signatures

Twisted Bilayer Graphene: Interlayer Configuration and Magnetotransport Signatures

Visualization of arrangements of carbon atoms in graphene layers by Raman mapping and atomic-resolution TEM

Basic Concepts and Recent Advances of Crystallographic Orientation Determination of Graphene by Raman Spectroscopy

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