IC’s radiation effects modeling and estimation

NeuroSOFM: A Neuromorphic Self-Organizing Feature Map Heterogeneously Integrating RRAM and FeFET

“…The interaction between neighboring neurons allows for the network to handle severe damage to itself and still operate at a functional level. This type of durability is fantastic for systems that are exposed to high-risk environments such as space (due to radiation exposure) [22] by not requiring monitoring and repairing systems. It also allows the architecture to utilize synaptic devices with lower durability if damaged neurons can be detected and shut off improving manufacturing scalability.…”

Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

“…The designed setup can be easily adopted for different types of radiation hardness tests of MCUs: single event effects and dose rate effects evaluations [14][15][16][17][18] as well as for a lot of other purposes tests. The developed solutions can be used for other types of test devices: FPGAs, memories, ADCs, DC-DC converters and others [19][20][21].…”

Temperature control system for the study of single event effects in integrated circuits using a cyclotron accelerator

“…The topological sizes of the elements of modern integrated circuits are less than 100 nm. Therefore, hard ion impact is a critical issue that should be considered for the correct estimation of the reliability of integrated circuits during space missions [1][2][3][4][5]. Local radiation effects are the most dangerous because hard ions are able to generate a relatively large amount of charge as they pass through the constituents of the microcircuits.…”

“…Other failure types include single event lutchup, single event burnout and single event gate rapture [1][2][3][4][5].…”