I12: the Joint Engineering, Environment and Processing (JEEP) beamline at Diamond Light Source

Drakopoulos, Michael; Connolley, Thomas; Reinhard, Christina; Atwood, Robert C.; Magdysyuk, Oxana V.; Vo, Nghia T.; Hart, Michael; Connor, Leigh D.; Humphreys, Bob; Howell, George; Davies, Steve; Hill, T. P.; Wilkin, Guy; Pedersen, U.; Foster, Andrew J.; Maio, Nicoletta De; Basham, Mark; Yuan, Fajin; Wanelik, Kaz

doi:10.1107/s1600577515003513

Cited by 254 publications

(178 citation statements)

References 49 publications

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“…This beamline utilises X-rays created by an insertion device, with an energy range of 50-150 kEV, tunable with a monochromator. The small size and weight of the RoToPEc meant that it could be installed on the inner hutch of this beamline (as described in [20]), giving a higher X-ray flux. The RoToPEc was installed within less than Figure 12.…”

Section: Example: In Situ Microtomographic Imaging At Simultaneous Hpmentioning

confidence: 99%

Rotating tomography Paris–Edinburgh cell: a novel portable press for micro-tomographic 4-D imaging at extreme pressure/temperature/stress conditions

Philippe

Godec

Mézouar

et al. 2016

High Pressure Research

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This paper presents details of instrumental development to extend synchrotron X-ray microtomography techniques to in situ studies under static compression (high pressure), shear stress or the both conditions at simultaneous high temperatures. To achieve this, a new rotating tomography Paris-Edinburgh cell has been developed. This ultra-compact portable device easily and successfully adapted to various multi-modal synchrotron experimental set-up at ESRF, SOLEIL and DIAMOND is explained in detail. An in-depth description of proof of concept first experiments performed on a high resolution imaging beamline is then given, which illustrate the efficiency of the set-up and the data quality that can be obtained. ARTICLE HISTORY

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Section: Example: In Situ Microtomographic Imaging At Simultaneous Hpmentioning

confidence: 99%

Rotating tomography Paris–Edinburgh cell: a novel portable press for micro-tomographic 4-D imaging at extreme pressure/temperature/stress conditions

Philippe

Godec

Mézouar

et al. 2016

High Pressure Research

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“…Experiments were carried out on beamline I12 (Diamond Light Source), using a linearly polarized monochromatic incident X-ray beam of energy 125 keV and bandwidth of 0.6 keV, selected by controlled bending of a double Laue monochromator (Drakopoulos et al, 2015). Compton scattering was detected close to back-scattering (2 $ 169 ) by a 23-element germanium solid-state detector.…”

Section: Experiments On Gafeomentioning

confidence: 99%

On the possibility of using X-ray Compton scattering to study magnetoelectrical properties of crystals

et al. 2016

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This paper discusses the possibility of using Compton scattering -an inelastic X-ray scattering process that yields a projection of the electron momentum density -to probe magnetoelectrical properties. It is shown that an antisymmetric component of the momentum density is a unique fingerprint of such time-and parity-odd physics. It is argued that polar ferromagnets are ideal candidates to demonstrate this phenomenon and the first experimental results are shown, on a single-domain crystal of GaFeO 3 . The measured antisymmetric Compton profile is very small (' 10 À5 of the symmetric part) and of the same order of magnitude as the statistical errors. Relativistic first-principles simulations of the antisymmetric Compton profile are presented and it is shown that, while the effect is indeed predicted by theory, and scales with the size of the valence spin-orbit interaction, its magnitude is significantly overestimated. The paper outlines some important constraints on the properties of the antisymmetric Compton profile arising from the underlying crystallographic symmetry of the sample.

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“…Synchrotron X-ray experiments were carried out at the Diamond light source, on I12 [22]. The beamline uses a 4.2 T superconducting wiggler to provide white beam and monochromatic X-rays in the energy range 50-150 keV.…”

Section: Experiments Set-upmentioning

confidence: 99%

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Michael (2015) Residual stress distribution in a Ti-6Al-4V T-joint weld measured using synchrotron X-ray diffraction. The Journal of Strain Analysis for Engineering Design, 50 (7).

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mentioning

confidence: 99%

Residual stress distribution in a Ti–6Al–4V T-joint weld measured using synchrotron X-ray diffraction

Zhang

Sun

et al. 2015

The Journal of Strain Analysis for Engineering Design

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Michael (2015) Residual stress distribution in a Ti-6Al-4V T-joint weld measured using synchrotron X-ray diffraction. The Journal of Strain Analysis for Engineering Design, 50 (7). pp. [445][446][447][448][449][450][451][452][453][454] Access from the University of Nottingham repository: http://eprints.nottingham.ac.uk/34567/1/NED-D-14-00493R1%20%28002%29.docx.pdf Copyright and reuse:The Nottingham ePrints service makes this work by researchers of the University of Nottingham available open access under the following conditions. This article is made available under the University of Nottingham End User licence and may be reused according to the conditions of the licence. For more details see: http://eprints.nottingham.ac.uk/end_user_agreement.pdf A note on versions:The version presented here may differ from the published version or from the version of record. If you wish to cite this item you are advised to consult the publisher's version. Please see the repository url above for details on accessing the published version and note that access may require a subscription.For more information, please contact eprints@nottingham.ac.uk 1 Residual stress distribution in a Ti-6Al-4V T-joint weld measured using synchrotron X-ray diffraction AbstractTo improve the manufacturing quality of welded structures, to prevent failures at weld joints and to predict their lifetime, measurements of the residual stresses generated by welding in the structures are extremely useful. The residual stresses may reduce the component life due to phenomena that occur at low applied stresses such as brittle fracture, fatigue and stress corrosion cracking. Welded thin Ti-6Al-4V panel components are commonly found in aeroengine assemblies and the weld integrity and reliability are critical. In this work, the residual stress distributions in a welded thin Ti-6Al-4V T-joint were measured by the newly developed SScanSS program with synchrotron X-ray diffraction technique. The measurement performed in this study, which included a large number of measurement points, has mapped a complete stress field in a thin sheet T-joint weld. It has not only provided improved understanding of residual stress in such a joint but also filled the missing link between the residual stress obtained by numerical modelling and their validation. The results have shown that the longitudinal stresses play the most important role in the residual stress distribution over the flange and high tensile stresses appear in the region near the weld zone. The measured results were compared with numerically predicted results and these showed good agreement.

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I12: the Joint Engineering, Environment and Processing (JEEP) beamline at Diamond Light Source

Cited by 254 publications

References 49 publications

Rotating tomography Paris–Edinburgh cell: a novel portable press for micro-tomographic 4-D imaging at extreme pressure/temperature/stress conditions

Rotating tomography Paris–Edinburgh cell: a novel portable press for micro-tomographic 4-D imaging at extreme pressure/temperature/stress conditions

On the possibility of using X-ray Compton scattering to study magnetoelectrical properties of crystals

Residual stress distribution in a Ti–6Al–4V T-joint weld measured using synchrotron X-ray diffraction

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