μ‐EXAFS, μ‐XRF, and μ‐PL Characterization of a Multi‐Quantum‐Well Electroabsorption Modulated Laser Realized via Selective Area Growth

Mino, Lorenzo; Gianolio, Diego; Agostini, Giovanni; Piovano, Andrea; Truccato, Marco; Agostino, Angelo; Cagliero, Stefano; Martı́nez-Criado, G.; d’Acapito, Francesco; Codato, Simone; Lamberti, Carlo

doi:10.1002/smll.201001229

Cited by 23 publications

(20 citation statements)

References 110 publications

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“…A corefinement approach on As and Ga K-edges was adopted. Unpublished table reporting data published in [116].…”

Section: Applications Of X-ray Micro Beams: Electroabsorption Modulatmentioning

confidence: 99%

“…Mino et al [116] investigated a SAG EML device based on AlxwGaywIn 1-xw-yw As/ Al xb Ga yb In 1-xb-yb As (compressive-strained well / tensile-strained barrier) MQW structures grown on InP by metallorganic vapor phase epitaxy. They reported -EXAFS spectra acquired at the ESRF ID22 beamline employing a pair of Kirkpatrick-Baez (KB) mirrors to reach a beam size of 1.7 m (vertical) × 5.3 m (horizontal), which allowed them to study in a space-resolved way the atomic local environment in the SAG and FIELD regions.…”

Section: Applications Of X-ray Micro Beams: Electroabsorption Modulatmentioning

confidence: 99%

“…In recent years space-resolved characterization at the (sub-)micrometric scale was made possible by the exponential increase in X-ray brilliance at III generation synchrotron radiation sources and by the impressive improvements in X-ray focusing devices [110]. In the field of materials characterization, they are becoming a key tool for the space-resolved determination of structural (XRD) [111][112][113][114] and electronic (XANES/EXAFS) properties [115,116] and for chemical speciation (XRF) [117][118][119][120] of nanostructured or composite materials. In particular, synchrotron radiation micro-/nano-beams can also be successfully employed to study devices based on nanostructured inorganic materials.…”

Section: Applications Of X-ray Micro Beams: Electroabsorption Modulatmentioning

confidence: 99%

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5. Structural and electronic characterization of nanosized inorganic materials by X-ray absorption spectroscopies

Borfecchia¹,

Agostini²,

Bordiga³

et al. 2013

Inorganic Micro- And Nanomaterials

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Starting from the late seventies, the progressively increased availability of synchrotron light sources has allowed the execution of experiments requiring a high X-ray flux in a continuous interval [1][2][3][4]. Among the various techniques developed, X-ray absorption spectroscopy (XAS, also known as X-ray absorption fine-structure, XAFS) [5][6][7][8][9][10][11][12][13] in both near (XANES) and post (EXAFS) edge regions, has become a powerful characterization technique widely employed in many research fields concerning inorganic chemistry, such as catalysis [13][14][15][16][17], organometallic and coordination complexes [18], metal nanoparticles [19, 20], electrochemical processes [21, 22], coordination polymers or metallorganic frameworks [23], bio-inorganic molecules including metalloproteins [24-27], chemistry of actinide elements [28], and solid state chemistry [12,[29][30][31].In this chapter, we will provide a brief introduction to the basic theory of XAS spectroscopy (Section 5.2), followed by selected examples having some didactic perspective (Sections 5.3-5.7). For the sake of brevity, only a fraction of the subjects mentioned above will be discussed; in particular, the chapter will deal with: the reactivity of the CuCl 2 /Al 2 O 3 -based catalysts for ethylene oxychlorination (Section 5.3); the structure, the electronic configuration and the reactivity of Cp 2 Cr molecules encapsulated in porous solids (Section 5.4); the structural characterization of metal complexes in solution (Section 5.5); the structural characterization of the UiO-66 and UiO-67 class of metallorganic frameworks (Section 5.6); and the determination of the local structure of an Alxw Gayw In 1−xw−yw As/Al xb Ga yb In 1−xb −yb As strained heterostructure grown on InP by metallorganic vapor phase epitaxy (Section 5.7) as an example of space-resolved EXAFS applied to a topic pertinent to solid state chemistry. XAS spectroscopy: Basic backgroundThe aim of this section is to provide the reader with a concise review of the basic physical principles on which the interpretation of EXAFS and XANES data is based. For a more detailed description of the theoretical background and the experimental aspects of XAS we refer to the extensive specialized literature (e.g., [5][6][7][8][9][10][11][12][13]).

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“…A corefinement approach on As and Ga K-edges was adopted. Unpublished table reporting data published in [116].…”

Section: Applications Of X-ray Micro Beams: Electroabsorption Modulatmentioning

confidence: 99%

Section: Applications Of X-ray Micro Beams: Electroabsorption Modulatmentioning

confidence: 99%

Section: Applications Of X-ray Micro Beams: Electroabsorption Modulatmentioning

confidence: 99%

See 1 more Smart Citation

5. Structural and electronic characterization of nanosized inorganic materials by X-ray absorption spectroscopies

Borfecchia¹,

Agostini²,

Bordiga³

et al. 2013

Inorganic Micro- And Nanomaterials

Self Cite

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show abstract

“…Such design grants multimodal imaging (e.g., simultaneous acquisition of XRD, XRF, and/or XAS). As a result, it is possible to obtain in parallel the crystallographic orientation and elemental or chemical distribution possible within heterogeneous samples with submicron resolution (Mino et al 2011). However, such setup involves numerous equipments: for example, multielement fluorescence detector, large-area CCD camera, and XYZ translation stage with continuous rotation about an axis.…”

Section: Introductionmentioning

confidence: 98%

Application of Micro- and Nanobeams for Materials Science

Martı́nez-Criado¹

2015

Synchrotron Light Sources and Free-Electron Lasers

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Owing to the spatial resolution and sensitivity (i.e., signal-to-background ratio), nano-and micro-X-ray beams are emerging tools with a strong impact in materials science. Although the optical quality of the X-ray focusing devices has limited the progress of X-ray microscopy, recent advances in fabrication techniques as well as in theoretical approaches have pushed the spatial resolution toward the diffraction limit. As a result, materials research using nano-and micro-X-ray beams has begun to extend toward the atomic domain, with concomitant and continuous developments of multiple analytical tools. The study of micro-/nanoscale objects, small embedded domains with weak signals, and/or heterogeneous structures at the (sub)micrometer scales has required the use of intense X-ray pencil beams. Additionally, stimulated by the great brilliance with reduced emittance of current third-generation synchrotron sources and new developments in X-ray detector technology, today intense (sub)micron X-ray beams are available with a variety of focusing devices. Finally, thanks to the multiple interactions of X-rays with matter, these X-ray probes can be used for manifold purposes, such as ultrasensitive elemental/chemical detection using X-ray fluorescence/X-ray absorption, or for identification of minority phases and/or strain fields by Xray diffraction with (sub)micron resolution. Here we describe how (sub)micrometer X-ray beams are produced and used today using refractive, reflective, and diffractive X-ray optics. We show that micro-and nano-X-ray beams are key tools for space-resolved determination of structural and electronic properties and for chemical speciation of nanostructured or composite materials. Selected recent examples will range from phase separation in single nanowires to visualization of dislocations and buried interfacial defects to domain distortions and quantum confinement effects. Keywords

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“…SAG of material needs only a simple procedure and thus is more fitful for mass production of low cost laser arrays. What is more, besides forming the laser array, SAG can be used for the integration of laser arrays with other optical component such as electroabsorption modulators (EAMs) at the same time [15][16][17][18][19].…”

Section: Introductionmentioning

confidence: 99%