S‐Parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties

Abstract

Figure 6Error induced by ignoring the dependence of distinctness on bit rate Figure 7 Measurement error when the linear fitted interference distinctness ␥ is used sig glected. If the OSNR of 0.1 nm resolution is 30 dB, which is the worst circumstance, the total ASE noise power is about y20 dB lower than the signal power because of the approximate 1 nm bandwidth of ASE noise. The typical crosstalk signal power is y30 dB lower than the signal power, so the crosstalk signal can be neglected.As a conclusion, the 0.5 dB error dynamic range reduces from the best value of 10᎐40 dB to the practical value of 10᎐30 dB. The first reason is the change of signal polarization. The other one is that we cannot measure the corresponding distinctness in each measurement. Only the linear fitted value can be used. The effect of crosstalk also contributes to this decrease. CONCLUSIONIn this paper, we introduce a novel method to monitor the optical signal-to-noise ratio in optical transport networks using a Mach᎐Zehnder interferometer. It is a simple, robust, and low-cost method. The experiments show that the method has high accuracy and a large dynamic range. The 0.5 dB error range is 10᎐40 dB for the best condition, while the practical value is 10᎐30 dB due to the effects of polarization, crosstalk, and bit rate. REFERENCES1.

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“…Complex r and r values are obtained from the S-parameter processing method developed in [6]. The processing method requires a rigorous electromagnetic analysis of the microstrip cell (direct problem) in order to take into account the quasi-TEM mode dispersion, together with an optimization procedure (inverse problem).…”

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“…Moreover, it allows a better concentration of the electric and magnetic fields into the substrate and metallic losses lower than the coplanar cell [7]. Among the characterization methods that use microstrip [4 -6], only the method developed in [6] permits the simultaneous extraction the complex permittivity and permeability of isotropic substrates. The present purpose is to extend it to the characterization of ferromagnetic materials in a form most useful to the engineering community.…”

Planar Microwave Sensors for Complex Permittivity Characterization of Materials and Their Applications

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Broadband Experimental Characterization of Artificial Magnetic Materials Based on a Microstrip Line Method

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