2004
DOI: 10.1116/1.1767830
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In situ nanoscale observation and control of electron-beam-induced cluster formation

Abstract: Electron-beam-induced strain within InGaN quantum wells: False indium "cluster" detection in the transmission electron microscopeWe have developed a method for controlled generation and in situ observation of nanoscopic metal clusters ͑Cu͒ on solid substrates: high-energy electron irradiation of weakly bonded salts (CuCl 2 ). Employing the primary electron beam of a scanning electron microscope as a metal-generating probe, we can initiate, observe, and control the nucleation and further evolution of Cu cluster… Show more

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Cited by 7 publications
(5 citation statements)
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References 18 publications
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“…The socalled electron-beam-induced deposition (EBID) involves decomposition of precursor materials in the gas, liquid, or solid phase. [29][30][31][32][33][34][35][36][37] A high-energy electron beam (10-300 keV) in SEM or transmission electron microscopy (TEM) is introduced into a low-pressure chamber through a microorifice or a membrane. This technique was also applied to modification of the electroplating surface.…”
Section: Resultsmentioning
confidence: 99%
“…The socalled electron-beam-induced deposition (EBID) involves decomposition of precursor materials in the gas, liquid, or solid phase. [29][30][31][32][33][34][35][36][37] A high-energy electron beam (10-300 keV) in SEM or transmission electron microscopy (TEM) is introduced into a low-pressure chamber through a microorifice or a membrane. This technique was also applied to modification of the electroplating surface.…”
Section: Resultsmentioning
confidence: 99%
“…It is mainly used to deposit thin metal films (Schlesinger and Paunovic, 2010). Electron-beam-induced deposition (EBID), on the other hand, has been studied to form cluster, metal nanowires, thin films, and nanostructures (Kiyohara et al, 2002; Adelung et al, 2004; Gazzadi and Frabboni, 2005; van Dorp et al, 2005; Randolph et al, 2006; Frabboni et al, 2008; Furuya, 2008; van Dorp and Hagen, 2008; Botman et al, 2009; de Boer et al, 2011; Vollnhals et al, 2013; den Heijer et al, 2014; Leenheer et al, 2015). The focused electron beam with high-energies of 10–50 keV in the conventional scanning or transmission electron microscope is transmitted through membranes and then hits the absorbed gases or ionic liquids on the substrate leading to decomposition of molecules.…”
Section: Emissive Properties and Applicationsmentioning
confidence: 99%
“…Electron-beam induced deposition, termed EBID, has been reported by several authors to form metal nanowires (12)(13)(14)(15)(16). However, the electron beam employed there is highenergy focused one used in the conventional scanning or transmission electron microscope.…”
Section: Ims Mapper Tuat and Tohoku Univ (This Work)mentioning
confidence: 99%