In situ and real-time ToF-SIMS analysis of light-induced chemical changes in perovskite CH3NH3PbI3

Xu, Duo; Hua, Xin; Liu, Shao-Chuang; Qiao, Hongwei; Yang, Hua Gui; Long, Yi‐Tao; Tian, He

doi:10.1039/c8cc01606b

Cited by 20 publications

(22 citation statements)

References 30 publications

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“…However, at lower laser scanning speed, the movement of cations in the perovskite crystal is promoted and concentrated at the defects and grain boundaries, leading to an uneven distribution of the potential field in the MAPbI 3 film and forming a large number of positive and negative electric centers in the film. At the same time, MAPbI 3 perovskite films will decompose to PbI 2 crystals, while MAI will decompose into CH 3 NH 2 and HI (Figure S1a, Supporting Information) . Here we focus on the (110) crystallization peak of the XRD pattern to demonstrate crystal structure changes in the MAPbI 3 perovskite film (Figure b).…”

Section: Resultsmentioning

confidence: 99%

Addressing the Reliability and Electron Transport Kinetics in Halide Perovskite Film via Pulsed Laser Engineering

Song

Tong

Liu

et al. 2019

Adv Funct Materials

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The long-term performance and stability of perovskites are adversely affected by their porous microstructure, tensile residual stress, and electron transport kinetics. Here, a high-speed pulsed laser processing technique is implemented to produce beneficial structural changes in organic-inorganic halide perovskites, including pore-free, crystalline structure, reduced defects, and tensile residual stress. Moreover, halide perovskite films can be converted from p-type to n-type semiconductor, which originates from crystal structure changes, giving rise to carrier dynamic changes. Comparing with traditional thermal annealing, residual tensile stress of perovskite thin film decreases by 40% after pulse laser processing, which significantly increases its stability. Pulse-laser-induced thermomechanical shock momentum can create pore-free perovskite thin films, contributing to much better reliability. Under humidity of 80% at room temperature for 500 h, the decomposition rate is reduced by more than two times, comparing thin films after pulsed laser processing with conventional thermal annealing. The thermal decomposition temperature of pulse-laser-processed perovskite thin film raises by 20 to about 220 °C. Pulse laser processing technique provides a scalable technique to tailor the structures in perovskite films with both temperature and loading control, further facilitates the design of perovskite-based devices for service under harsh conditions, and also contributes to high-performance optoelectronic applications.

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Section: Resultsmentioning

confidence: 99%

Addressing the Reliability and Electron Transport Kinetics in Halide Perovskite Film via Pulsed Laser Engineering

Song

Tong

Liu

et al. 2019

Adv Funct Materials

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“…b) TOF‐SIMS 2D images of I − and PbI 3 − acquired after red laser illumination for 0, 10, 15, and 20 min; c) TOF‐SIMS depth profiles of the CH 3 NH 3 PbI 3 film under red laser illumination for 0 (black line), 20 (red line), 40 (blue line), and 60 (green line) min. Inset: the magnified view of PbI 3 − signal changes within the sputter time of 20–80 s. Reproduced with permission . Copyright 2018, The Royal Society of Chemistry.…”

Section: Characterizations Of Ion Migration In Hoip Materials and Devmentioning

confidence: 99%

Ion Migration: A “Double‐Edged Sword” for Halide‐Perovskite‐Based Electronic Devices

2019

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Ion migration has been regarded as one of the most interesting and mysterious processes in halide-perovskite-based electronic devices. On the one hand, ion migration contributes to the hysteresis and poor stability problems of perovskite devices. On the other hand, the mobile ions can passivate the interfaces of perovskite devices, leading to improved carrier transportation and collection. This article gives a critical review on the ion migration in halide perovskite materials. It starts with a brief introduction of the origin and nature of the ion migration problem in perovskite materials. Next, the electric, photoelectric, and structural phenomena resulting from ion migration and their influence on the performance and stability of the perovskite devices are focused on. The recent literature work on the characterization of ion migration is reviewed and the characterization techniques are highlighted. Furthermore, different approaches that can suppress the ion migration process are also introduced. Finally, ion migration in the emerging all-inorganic halide perovskite materials is compared with that in hybrid halide perovskite materials, and the implications on device design and performance are discussed.

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“…[103] It was also found that the migration of the iodine-related species, which is quasi-reversible, play more important roles under the illumination of light with larger wavelength. [104] In addition, the light with shorter wavelength induces more significant degradation of MAPbI 3 . [104] In device with a TiO 2 layer, the light-induced iodine diffusion into the TiO 2 layer can also lead to the degradation of the TiO 2 layer, limiting the device stability.…”

Section: Light and Temperature Effectsmentioning

confidence: 99%

“…[104] In addition, the light with shorter wavelength induces more significant degradation of MAPbI 3 . [104] In device with a TiO 2 layer, the light-induced iodine diffusion into the TiO 2 layer can also lead to the degradation of the TiO 2 layer, limiting the device stability. [105] ToF-SIMS also revealed that the photovoltaic performance enhancement by light soaking is due to ion redistribution in a solar cell with structure of NiO/perovskite/PCBM, where the light illumination induces MA + accumulation at the perovskite/PCBM interface and I − accumulation at the perovskite/NiO interface, leading to increased open-circuit voltage and fill factor.…”

Section: Light and Temperature Effectsmentioning

confidence: 99%

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Liu

Lorenz

Ievlev

et al. 2020

Adv Funct Materials

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Metal halide perovskite (MHP) solar cells have attracted much attention due to the rapidly growing power conversion efficiency that has reached 25.2% in a decade, comparable to established commercial photovoltaic modules. Compositional engineering is one of the most effective methods to boost the performance of MHP solar cells. Further improving the efficiency and the stability of MHP solar cells necessitates good understanding of the chemical–efficiency correlation and the chemical evolution during the degradation of MHP solar cells. In this regard, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a powerful tool to investigate the chemical aspect of MHPs and has played an important role in advancing the development of MHP optoelectronics. However, up to date, a review that can guide future utilization of ToF‐SIMS in the MHP development is missing. Herein, the capabilities of ToF‐SIMS in MHP investigations are summarized and analyzed from simple material synthesis and chemical distribution to more complicated device operation mechanism and stability. The strength of ToF‐SIMS in resolving important issues in this field, such as interface composition, ion migration, and degradation in MHP is highlighted. Finally, an outlook with an emphasis on making the utmost of ToF‐SIMS in developing MHP devices is provided.

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In situ and real-time ToF-SIMS analysis of light-induced chemical changes in perovskite CH₃NH₃PbI₃

Cited by 20 publications

References 30 publications

Addressing the Reliability and Electron Transport Kinetics in Halide Perovskite Film via Pulsed Laser Engineering

Addressing the Reliability and Electron Transport Kinetics in Halide Perovskite Film via Pulsed Laser Engineering

Ion Migration: A “Double‐Edged Sword” for Halide‐Perovskite‐Based Electronic Devices

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

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