2016
DOI: 10.1299/jsmekyushu.2016.69.361
|View full text |Cite
|
Sign up to set email alerts
|

I-11 Optimization of mixed colloidal silica and fullerenol slurry in Chemical Mechanical Polishing of Sapphire

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2017
2017

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…They reported that the material removed from polished substrates adhered to fine particles after the CMP, which is increase in fine particle size in the slurry. [16][17][18][19][20][21] However, the characteristics of abrasive particles during CMP are still unclarified and must be studied further. In this research, we studied the change in fine particle size in slurries including its effect on the performance of the CMP technique.…”
Section: Introductionmentioning
confidence: 99%
“…They reported that the material removed from polished substrates adhered to fine particles after the CMP, which is increase in fine particle size in the slurry. [16][17][18][19][20][21] However, the characteristics of abrasive particles during CMP are still unclarified and must be studied further. In this research, we studied the change in fine particle size in slurries including its effect on the performance of the CMP technique.…”
Section: Introductionmentioning
confidence: 99%