2015
DOI: 10.1063/1.4913209
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Hysteresis modeling in graphene field effect transistors

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Cited by 8 publications
(7 citation statements)
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“…The lack of dispersion may be attributed to the fact that the devices as fabricated are unpassivated, thus precluding interface traps and associated material degradation resulting from dielectric deposition. 24 Responsivity in GND detectors may be interpreted as a consequence of two interacting nonlinearities: the charge neutrality nonlinearity near zero bias and the saturation nonlinearity at high bias ( Fig. 2(a)).…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…The lack of dispersion may be attributed to the fact that the devices as fabricated are unpassivated, thus precluding interface traps and associated material degradation resulting from dielectric deposition. 24 Responsivity in GND detectors may be interpreted as a consequence of two interacting nonlinearities: the charge neutrality nonlinearity near zero bias and the saturation nonlinearity at high bias ( Fig. 2(a)).…”
mentioning
confidence: 99%
“…The quantity qðÞ in C q represents the density of states in graphene as a function of chemical potential (). [22][23][24] The quasiFermi potential (v) along the length of the nanowire may be ). This results in a current density which varies quadratically with drain bias In this analysis, the chemical potential is assumed to be constant across the width of the nanowire.…”
mentioning
confidence: 99%
“…Deviations from a frequency‐independent transconductance might appear due to for instance a slow charging of the graphene–electrolyte interface capacitance or a slow filling and depletion of trap states in the graphene environment. [ 28,29 ] In addition, displacement currents through parasitic capacitances at the graphene–electrolyte interface can also result in the attenuation of the signal. [ 30 ] Here, we have characterized the frequency dependence of the magnitude and phase of the g‐SGFETs transfer function.…”
Section: Resultsmentioning
confidence: 99%
“…3 where experimental data from [5] has been replotted on a semilogarithmic scale. GFET hysteresis effects are well known, and are generally believed to be due to the charging and discharging of dielectric interface states [7][8][9][10].…”
Section: A Leakage Measurementsmentioning
confidence: 99%