“…In the context of binary class classification, hundreds of different defect prediction models have been published. To build these models, researchers have used various classification techniques to build the defect prediction models such as Logistic Regression [24], NB [23], SVM [26], ANN [39], Genetic Programming [40], Ant Colony Optimization [14], Particle Swarm Optimization [41], RF [42], Case Based Reasoning [30], DT [25], ensemble methods [16,28,29,43,44], EM [31], Fuzzy clustering [33], K-means clustering [32], Association Rule Mining [45], and the Artificial Immune Systems [46,47].…”