2021
DOI: 10.1002/adom.202101553
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Hybrid Perovskite Degradation from an Optical Perspective: A Spectroscopic Ellipsometry Study from the Deep Ultraviolet to the Middle Infrared

Abstract: A quantitative analysis of the thermally induced degradation of various device‐relevant multi‐cation hybrid perovskite films is performed using spectroscopic ellipsometry, for temperatures between 80 and 120 °C. The studied compositions are a triple cation perovskite Cs0.05(MA0.17FA0.83)0.95Pb(Br0.17I0.83)3, a Rb‐containing variant Rb0.05Cs0.05(MA0.17FA0.83)0.90Pb(Br0.17I0.83)3, and a methylammonium‐free Rb0.05Cs0.10FA0.85PbI3 composition. A very wide combined spectral range of 200 nm to 25 μm is covered by co… Show more

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Cited by 12 publications
(9 citation statements)
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References 44 publications
(144 reference statements)
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“…Step 5: An accurate dispersion model for each layer is chosen based on the material considered. For example, while Lorentz oscillators can closely model the TiO 2 layers, the perovskite would require a number of Tauc-Lorentz oscillators additionally and the ITO would need to be modeled with a combination of new amorphous (based on Forouhi-bloomer) and Drude dispersion models . The suitability of models is readily available in literature for reference.…”
Section: Device Simulationsmentioning
confidence: 99%
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“…Step 5: An accurate dispersion model for each layer is chosen based on the material considered. For example, while Lorentz oscillators can closely model the TiO 2 layers, the perovskite would require a number of Tauc-Lorentz oscillators additionally and the ITO would need to be modeled with a combination of new amorphous (based on Forouhi-bloomer) and Drude dispersion models . The suitability of models is readily available in literature for reference.…”
Section: Device Simulationsmentioning
confidence: 99%
“…For instance, Tejada et al measured the optical constants of perovskite films deposited in a N 2 -purged glovebox as an indicator of their thermal excitation-induced degradation. To be able to neglect any degradation while measuring, the ellipsometer itself was purged with N 2 and the ambient conditions were maintained at 20 °C and less than 20% relative humidity . Subiao and co-workers showed that perovskite films left in controlled ambient conditions for a period of time underwent degradation which was duly reflected in the change in optical constants obtained from periodic ellipsometry data.…”
Section: Challengesmentioning
confidence: 99%
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“…Moreover, the shallow light penetration depth and the surface roughness led to higher uncertainties in the measurements of the optical properties and constants [51].…”
Section: Ellipsometry Analysismentioning
confidence: 99%