A method is developed
for extracting the direct current conductivity
(σdc) of ion-conducting materials from frequency-
and time-domain dielectric spectroscopy measurements. This method
exploits the electrode polarization effects arising from the charging
of an ion-blocking capacitor and provides a useful way of obtaining
σdc for ionic conductors that do not exhibit a frequency-
(time-) independent conductivity plateau; the latter absence of plateau
is often encountered in the case of thin-film materials. It allows,
by proper design of the test cells, the estimation of σdc independently of the specimen thickness, as demonstrated
herein for SiO2 blocking layers and electrolyte systems
made of a polyoxometalate (POM) molecule embedded in poly(methyl methacrylate)
(PMMA) polymeric matrices. For different postpreparation and measurement
conditions, the σdc values obtained for thick (8
μm) POM–PMMA layers are in good agreement not only with
the observed conductivity plateaus but also with the values determined
in the case of thin (270 nm) POM–PMMA layers for which no plateau
is detected. The proposed method allows for the probing of a possible
dependence of material properties on thickness and is of substantial
interest for low-dimensional systems. The applicability and accuracy
of the method are discussed and assessed in relation to the main methods
currently used in the field.