Hot-electron degradation in hydrogenated amorphous-silicon-nitride thin-film diodes

Abstract

Articles you may be interested inHydrogenated amorphous silicon oxide containing a microcrystalline silicon phase and usage as an intermediate reflector in thin-film silicon solar cells Enhanced adhesion and performance of the source/drain electrode using a single-layered Ag(Cu) film for an amorphous silicon thin-film transistor Appl. Phys. Lett. 83, 3419 (2003); 10.1063/1.1621074 Voltage switching and oscillations in a single barrier heterostructure hot-electron diode