2019
DOI: 10.1116/1.5067269
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High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint lithography technology

Abstract: Next generation electronic devices like single electron transistors (SETs) operating at room temperature (RT) demand for high-resolution patterning techniques and simultaneously cost-effective, high-throughput manufacturing. Thereby, field-emission scanning probe lithography (FE-SPL) is a direct writing method providing high-resolution and high-quality nanopatterns. SET devices prepared by FE-SPL and plasma etching at cryogenic substrate temperature were shown to operate at RT [C. Lenk et al., Microelectron. E… Show more

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Cited by 4 publications
(4 citation statements)
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“…We demonstrated a complementary mix-and-match lithography combining standard electron beam lithography with a closed-loop FE-SPL method for proof-of-concept [61]. In addition, using active cantilever arrays enables scalability, further enhancing the throughput capability [91].…”
Section: Discussionmentioning
confidence: 99%
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“…We demonstrated a complementary mix-and-match lithography combining standard electron beam lithography with a closed-loop FE-SPL method for proof-of-concept [61]. In addition, using active cantilever arrays enables scalability, further enhancing the throughput capability [91].…”
Section: Discussionmentioning
confidence: 99%
“…Calixarene molecular glass is a resist on which FE-SPL exceeds the limits of standard EBL. In this context, FE-SPL is a promising tool for future rapid nanoscale manufacturing [85][86][87] and high-resolution nanoimprint lithography template fabrication [91,93,94].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…14 Furthermore, SPL can be used for fabricating molds for nanoimprint lithography reducing further the limitation of serial processing. 15 After SPL patterning, a solubility change is observed in the exposed area resulting either in positive-tone patterning, if the exposed region becomes soluble, or in negative-tone patterning otherwise. 16 When the resist is exposed in negative-tone patterning, a latent image is observed on the resist before development.…”
Section: Introductionmentioning
confidence: 99%