Herein, the effects of Si ion implantation on GaN in a dose range of 10 11 -10 14 cm À2 towards a GaN-based monolithic inverter circuit consisting of n-channel enhancement-and depletion-mode MOSFETs (E-MOSFET and D-MOSFET) are investigated. The implantation dose dependence is investigated by capacitance-voltage (C-V ) measurement of Si-implanted GaN metal-oxide-semiconductor (MOS) capacitors. Enhanced stretches of C-V curve in voltage bias direction in higher dose samples and its nonlinear dependence on Si dose are discussed. Characteristics of E-and D-MOSFET fabricated on p-GaN with Mg doping concentration of ½Mg ¼ 1 Â 10 19 cm À3 on sapphire substrate are presented. The operation of E-and D-MOSFET with normally-on and normally-off characteristics is obtained. To further improve MOSFET characteristics, a low Mg concentration p-GaN layer with [Mg] of 1Â10 17 cm À3 on GaN substrate is used for monolithic E-and D-MOSFET fabrication. Improved E-MOSFET characteristics are confirmed by effective mobility of 38 cm 2 (V s) À1 . The successful operation of an enhancement/ depletion (E/D)-type inverter with a maximum voltage gain 1.5 beyond unity is presented in monolithic E-and D-MOSFET on the same chip.