2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2018
DOI: 10.1109/ispsd.2018.8393606
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High-speed, high-reliability GaN power device with integrated gate driver

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Cited by 63 publications
(12 citation statements)
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“…This method offers smalller circuit area and superior switching performance compared to conventional discrete driving methods due to the reduction of parasitic inductance. Therefore, it is expected to be a promising candidate and also the related works have been reported the same in [28,29,30]. However, there are still few papers that take into account the problems of GaN HEMTs.…”
Section: Monolithic Integrationmentioning
confidence: 95%
“…This method offers smalller circuit area and superior switching performance compared to conventional discrete driving methods due to the reduction of parasitic inductance. Therefore, it is expected to be a promising candidate and also the related works have been reported the same in [28,29,30]. However, there are still few papers that take into account the problems of GaN HEMTs.…”
Section: Monolithic Integrationmentioning
confidence: 95%
“…In the GaN wafer process not only the single power switch can be manufactured, also further transistor(s) or diodes can be integrated to form e.g. a half bridge [9], [10]. With the integration of enhancement and depletion mode transistors NAND, NOR or NOT logic patterns can be built [11].…”
Section: Monolithic Integration In Ganmentioning
confidence: 99%
“…For power‐electronic applications, normally off and normally on high‐voltage HFETs can be combined with diodes, i.e. for reverse conduction and with normally off and normally on low‐voltage HFETs for gate driving [28, 30] and logic [31]. Monolithic half‐bridges and related topologies can be realised as inverter cells with very small commutation loops [32].…”
Section: Lateral Gan Transistorsmentioning
confidence: 99%