2012 Symposium on VLSI Technology (VLSIT) 2012
DOI: 10.1109/vlsit.2012.6242461
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High-speed and reliable domain wall motion device: Material design for embedded memory and logic application

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Cited by 25 publications
(14 citation statements)
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“…To tackle this issue, a field-free deterministic SOT switching was reported in the literature and enacted by utilizing a lateral wedge oxide, 7 tilted magnetic easy axis, 8 antiferromagnetic layer, 9,10 or hybrid ferromagnetic/ ferroelectric structure. 11 On the other hand, an alternative three-terminal magnetic memory was reported using the STT-driven domain wall (DW) motion, 12,13 where the switching is achieved by moving a DW back and forth along the magnetic wire. The key requirement of the DW motion device is to initialize the magnetization at the two ends of wire in opposite directions.…”
mentioning
confidence: 99%
“…To tackle this issue, a field-free deterministic SOT switching was reported in the literature and enacted by utilizing a lateral wedge oxide, 7 tilted magnetic easy axis, 8 antiferromagnetic layer, 9,10 or hybrid ferromagnetic/ ferroelectric structure. 11 On the other hand, an alternative three-terminal magnetic memory was reported using the STT-driven domain wall (DW) motion, 12,13 where the switching is achieved by moving a DW back and forth along the magnetic wire. The key requirement of the DW motion device is to initialize the magnetization at the two ends of wire in opposite directions.…”
mentioning
confidence: 99%
“…The DW integration determines the number of ones in a given bit stream. According to the experimental work reported in [44], the reliability of a typical domain wall device is excellent. For example, a Co/Ni wire can achieve a 10-year retention time at 150 degrees and 1 × 10 14 times write.…”
Section: Error Analysismentioning
confidence: 99%
“…For example, a Co/Ni wire can achieve a 10-year retention time at 150 degrees and 1 × 10 14 times write. In addition, the experiments in [44] have also shown that the domain wall velocity and critical current are not sensitive to external magnetic field or temperature.…”
Section: Error Analysismentioning
confidence: 99%
“…Our delay circuit uses the design of an MRAM device with four terminals, such as a domain wall motion (DWM) device [5], and a spin-Hall-effect (SHE) device [6][7] [8] to overcome this issue. The four-terminal device is shown in Fig.…”
Section: A Designmentioning
confidence: 99%