High-Speed AFM Image Scanning Using Observer-Based MPC-Notch Control

Rana, M. S.; Pota, H. R.; Petersen, Ian R.

doi:10.1109/tnano.2013.2243752

Cited by 58 publications

(32 citation statements)

References 27 publications

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“…Many other feedback control techniques have been used instead of a PI controller to improve the accuracy and speed of the AFM [9][10][11][12]. A signal transformation method is implemented to track the reference triangular signal in Habibullah, Hemanshu Pota, and Ian R. Petersen an AFM in [13].…”

Section: Introductionmentioning

confidence: 99%

Reduction of phase error between sinusoidal motions and vibration of a tube scanner during spiral scanning using an AFM

Habibullah

Pota

Petersen

2016

Int. J. Control Autom. Syst.

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The design of a phase-locked loop (PLL)-based proportional integral (PI) controller for compensating the phase error between motions from the lateral axes of a piezoelectric tube scanner (PTS) during spiral scanning for an atomic force microscope (AFM) is proposed in this paper. Spiral motion of the PTS for scanning of material surfaces or biological samples using an AFM is achieved by applying two sinusoidal signals with a 90 degree phase-shift and of varying amplitudes to the X and Y-axes of the scanner. The phase error between the X and Y-axes positions and scanner's vibration due to its mechanical properties increase with increasing scanning speeds which reduce the imaging performance of the AFM at high frequencies. In the proposed control scheme, a vibration compensator is used with the X and Y-PTS to damp the vibration of the PTS at its resonant frequency and the phase error between the displacements of the two lateral axes of the scanner is measured by a phase detector and a PI controller is used to reduce the error. Comparisons of experimental results for reference tracking and imaging performance with the AFM PI controller demonstrate the efficiency of the proposed control method.

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Section: Introductionmentioning

confidence: 99%

Reduction of phase error between sinusoidal motions and vibration of a tube scanner during spiral scanning using an AFM

Habibullah

Pota

Petersen

2016

Int. J. Control Autom. Syst.

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“…Many researchers have used feedback control techniques instead of PI controllers to improve the accuracy and speed of the AFM [5]- [10]. A signal transformation method is implemented to track the reference triangular signal in an AFM in [11].…”

Section: Introductionmentioning

confidence: 99%

High-precision spiral positioning control of a piezoelectric tube scanner used in an atomic force microscope

Habibullah

Pota

Petersen

2014

2014 American Control Conference

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This paper considers a high-speed spiral scanning method using an atomic force microscope (AFM). In it, spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes in the X and Y-axes, respectively, of the AFM's piezoelectric tube (PZT) scanner. Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian (LQG) controller is designed to track the reference sinusoidal signal. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoid from the X and Y-PZTs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. Also, a fifthorder Butterworth filter is used to filter noises in the signals emanating from the position sensors. A comparison of images scanned using the proposed controller (spiral) and the AFM proportional integral (PI) controller (raster) provide evidence of the efficacy of the proposed method.

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“…Vibration is another factor to limit the scanning speed of the AFMs. A number of feedback control techniques have been proposed for vibration control of the PTS, such as positive position feedback [10], integral resonant control [11], H f [12], and model predict control [13]. The main complication with the feedback-based techniques is the need of a displacement sensor, which significantly increases the complexity and cost.…”

Section: Introductionmentioning

confidence: 99%

Improving scanning speed of the AFMs with inversion-based feedforward control

Yang

et al. 2014

2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3m-Nano)

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This paper presents the design and experimental implementation of an inversion-based feedforward controller to achieve accurate tracking and fast scanning for an atomic force microscopy (AFM). The proposed controller reduces the tracking error by inverting the vibration dynamics and the hysteresis of the piezoelectric tube scanner (PTS). The hysteresis is compensated by directly constructing an inverse PrandtlIshlinskii model, while the vibration dynamics is suppressed by a zero magnitude error tracking controller. A comparison of the experimental images using the proposed controller and a dc-gain open-loop controller is given. The experimental results demonstrate the effectiveness of the proposed controller.

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High-Speed AFM Image Scanning Using Observer-Based MPC-Notch Control

Cited by 58 publications

References 27 publications

Reduction of phase error between sinusoidal motions and vibration of a tube scanner during spiral scanning using an AFM

Reduction of phase error between sinusoidal motions and vibration of a tube scanner during spiral scanning using an AFM

High-precision spiral positioning control of a piezoelectric tube scanner used in an atomic force microscope

Improving scanning speed of the AFMs with inversion-based feedforward control

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