2013
DOI: 10.1109/led.2013.2275169
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High-Sensitivity and Fast-Response Graphene/Crystalline Silicon Schottky Junction-Based Near-IR Photodetectors

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Cited by 139 publications
(99 citation statements)
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“…The pristine Gr/Si device exhibits the maximum R I around 140 mAW −1 for the incident light with wavelength ranging from 650 to 850 nm. After MoO 3 deposition, R I was significantly boosted for the wide spectrum from ultraviolet to near infrared, particularly by nearly three times to ≈400 mAW −1 for the wavelength around 750 nm, which is much larger than that of previous report . Furthermore, the MoO 3 modification enhanced the corresponding EQE by almost four times up to ≈80% for the visible light regime, as shown in Figure b, which is much larger than that of TFSA doped Gr/Si devices .…”
mentioning
confidence: 64%
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“…The pristine Gr/Si device exhibits the maximum R I around 140 mAW −1 for the incident light with wavelength ranging from 650 to 850 nm. After MoO 3 deposition, R I was significantly boosted for the wide spectrum from ultraviolet to near infrared, particularly by nearly three times to ≈400 mAW −1 for the wavelength around 750 nm, which is much larger than that of previous report . Furthermore, the MoO 3 modification enhanced the corresponding EQE by almost four times up to ≈80% for the visible light regime, as shown in Figure b, which is much larger than that of TFSA doped Gr/Si devices .…”
mentioning
confidence: 64%
“…Assuming that shot noise from the dark current mainly contributes to the total noise, the detectivity can be evaluated by the formula D*=JSCS1/2/P(2eInormalD)1/2where S is the device area, and I D is the dark current at zero voltage. As presented in Figure c, the D * of Gr/Si photodetector remarkably increased from ≈9 × 10 11 to ≈5.4 × 10 12 Jones for λ ranging from 600 to 800 nm after MoO 3 decoration, which is one order of magnitude higher than that of the previous report . Figure d shows the photovoltage responsivity ( R V ) of pristine and MoO 3 modified Gr/Si photodetectors in open circuit mode as a function of light wavelength, where R V is defined by RnormalV=VOC/PS.…”
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confidence: 71%
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“…The Schottky junction photodetector exhibits significant photovoltaic characteristics with 51.8 mA W −1 optical responsivity and 2 × 10 4 light on/off ratio at zero bias. Subsequently, an infrared Schottky junction photodetector based on a graphene/Si Schottky junction was constructed by combining a single layer of graphene (MLG) film and fast bulk silicon . It is worth noting that due to the strong photovoltaic characteristics and built‐in electric field of the MLG/Si Schottky junction, the photodetector can achieve self‐powered photodetector behavior without external voltage bias.…”
Section: D Material‐based Schottky Junction Photodetectorsmentioning
confidence: 99%
“…28 Graphene (Gr), a single-layer of carbon sheet, exhibits excellent electronic conductivity [29][30][31] and optical transmittance [32][33][34] with great potential to replace metals as transparent electrodes. [35][36][37][38][39][40][41][42] Gr/Si structures have been studied in solar cells, 36,38,39 as well as, visible and INR photodetectors, 41,[43][44][45][46][47][48] showing excellent performances. Ultra-shallow (essentially, zero X J ) Gr/Si Schottky structure could be more suitable for UV detection, because it not only resolves the serious surface recombination due to the shallow junction satisfying the UV light penetration depth in Si, but also simplifies the fabrication process to reduce the cost.…”
Section: Introductionmentioning
confidence: 99%