High resolution x-ray characterization of Co films on Al2O3

Stierle, Andreas; Abromeit, A.; Metoki, Naoto; Zabel, H.

doi:10.1063/1.353846

Cited by 34 publications

(15 citation statements)

References 8 publications

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“…3 reveals a singlecrystalline hexagonal Co film with ͑0002͒-oriented growth on the c-Al 2 O 3 substrate similar to the results found from deposition on the ␣ plane of sapphire in Ref. 44. The corresponding pole figure scan in Fig.…”

Section: Sample Preparation and Experimental Detailssupporting

confidence: 66%

Scaling behavior of the exchange-bias training effect

2007

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The dependence of the exchange-bias training effect on temperature and ferromagnetic film thickness is studied in detail and scaling behavior of the data is presented. Thickness-dependent exchange bias and its training are measured using the magneto-optical Kerr effect. A focused laser beam is scanned across a Co wedge probing local hysteresis loops of the Co film which is pinned by an antiferromagnetic CoO layer of uniform thickness. A phenomenological theory is best fitted to the exchange-bias training data resembling the evolution of the exchange-bias field on subsequently cycled hysteresis loops. Best fits are done for various temperatures and Co thicknesses. Data collapse on respective master curves is achieved for the thickness and temperature-dependent fitting parameters as well as the exchange bias and coercive fields of the initial hysteresis loops. The scaling behavior is strong evidence for the validity and the universality of the underlying theoretical approach based on triggered relaxation of the pinning layer towards quasiequilibrium.

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Section: Sample Preparation and Experimental Detailssupporting

confidence: 66%

Scaling behavior of the exchange-bias training effect

2007

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“…Additionally, well pronounced Kiessig fringes from the total thickness of the superlattice are visible, indicating sharp interfaces with weak interdiffusion and low roughness. 27 A fit with the Parratt formalism 28 gave a root mean square ͑RMS͒ interface roughness parameter of = 0.2 nm, comparable to earlier reports on similar ͓Fe/ V͔ n superlattice structures. 25,[29][30][31][32][33][34] In Fig.…”

Section: A Structural Propertiessupporting

confidence: 63%

Superconducting spin valves based on epitaxial Fe/V superlattices

et al. 2008

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In superconducting spin valves of the type S/F1/N/F2 or F1/S/F2 with a superconducting layer S, two ferromagnetic layers F1 and F2, and a normal metallic layer N, the superconducting transition temperature T S depends on the relative magnetization direction of the ferromagnetic layers F1 and F2. The difference of the transition temperature ⌬T S = T s AP − T s P with the magnetization direction of F1 and F2 either antiparallel or parallel is called the superconducting spin valve effect. We have prepared both types of spin valves by growing Fe/V thin-film heterostructures with epitaxial quality on MgO͑001͒ substrates. In the S/F1/N/F2-type spin valves the ferromagnetic layers were the first two Fe layers of a ͓Fe/V͔ superlattice coupled antiferromagnetically via the interlayer exchange interaction. Here we observed a superconducting spin valve shift of up to ⌬T S Ϸ 200 mK when aligning the sublattice magnetization in an external magnetic field. In the F1/S/F2-type spin valves the ferromagnetic layer F1 was either a ͓Fe/V͔ or a ͓Fe x V 1−x / V͔ superlattice, the F2 layer was a Fe-, a Co-, or a Fe x V 1−x film. Using weakly ferromagnetic Fe x V 1−x alloy layers as F1 and F2 we find a spin valve effect of up to ⌬T S Ϸ 20 mK, which is more than a factor of 2 larger than reported in the literature before for spin valves with comparable transition temperatures. Our results indicate that a high interface transparency and a large superconducting correlation length are prerequisites for the observation of a sizable superconducting spin valve effect.

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“…For each sample X-ray reflectivity scans in the range 2Y ¼ 0:4220 , radial scans in the range 2Y ¼ 40280 , and transverse scans (o-scans) around the main peaks were made [16,17]. No higher order peaks from the superlattice structure were found in the range 80 p2Yp120 , as verified by complementary scans on each sample.…”

Section: Structural Characterizationmentioning

confidence: 99%