High-Resolution Electron Microscopy on Epitaxial Pb(Mg1/3Nb2/3)O3 Film Prepared by Sol-Gel Method

Okuwada, Kumi; Nakamura, Shin; Imai, Motomasa; Kakuno, K.

doi:10.1143/jjap.30.l1052

Cited by 20 publications

(4 citation statements)

References 7 publications

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“…lowest activation energies for vaporization~Sata, 1992!. In studies related to thin films and based on lead-based perovskites, it has been observed that the $100% faces have the lowest surface energies~Okuwada et al., 1989, 1991Tani et al, 1993!. This is valid also for SrTiO 3~S ano et al, 2003!.…”

Section: Discussionmentioning

confidence: 74%

Electron Microscopy Studies of Potassium Sodium Niobate Ceramics

et al. 2005

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Using electron microscopy, K0.5Na0.5NbO3 (KNN) ceramics sintered at 1030 degrees C for 8 h and 1100 degrees C for 2 and 24 h was studied. The scanning electron microscopy and X-ray spectrometry revealed that the materials consisted of a matrix phase in which the (Na+K)/Nb ratio corresponded closely to the nominal composition and a small amount of Nb-rich secondary phase. A bimodal microstructure of cube-shaped grains was revealed in the fracture and thermally-etched surfaces of the KNN. In the ceramics sintered at 1100 degrees C, the larger grains (up to 30 mum across), contained angular trapped pores. The transmission electron microscopy analysis revealed that the crystal planes of the grains bordering the intragranular pore faces were of the {100} family with respect to the simple perovskite cell. Ferroelectric domains were observed in the grains of this material.

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Section: Discussionmentioning

confidence: 74%

Electron Microscopy Studies of Potassium Sodium Niobate Ceramics

et al. 2005

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“…Preferred orientations have been reported for the sol-gel method on lattice matched SrTiO 3 and MgO single crystal substrates 3 ,4 and some were confirmed to be epitaxial by TEM. 5 In addition, preferred orientations were reported for perovskite thin layers deposited on polycrystalline Pt. 6,7, 8 (111) and (100) orientations can develop on a commonly used multilayer substrate, Pt/Ti/SiO2/Si, where the face-centered Pt layer has a self-textured (111) orientation.…”

Section: Introductionmentioning

confidence: 99%

Preferred Orientations for Sol-Gel Derived Plzt Thin Layers

1993

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PLZT thin layers were deposited onto various substrates by sol-gel methods, and crystallized under different conditions and substrate treatments. Relationships are given for the chemical characteristics of the substrate's surface and the preferred orientations which develop on heat treatment. A preferred (11) orientation always developed for perovskite crystallized on Pt layers which contained Ti on the surface. This was attributed to the formation of Pt 3 Ti and the role of heteroepitaxial nucleation and growth sites. In addition, a preferred (100) orientation was also obtained on unannealed Ptfri/SiO2QSi substrates which were free of Ti on the surface. This was attributed to self-textured growth with flat faces striving for minimum surface energy conditions. The results are discussed in terms of the importance of interfacial chemistry on the control of texture for crystallization of PLZT thin layers on coated substrates.

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“…Transmission electron microscopy ͑TEM͒ investigations have confirmed the existence of 1:1 ordered nanodomains in a disordered matrix in PMN films. 12 The electron diffraction 16 and Raman spectroscopy 17 also indicated that the microstructures of the films are similar to those of the bulks. Therefore the model Hamiltonian previously proposed 3 to describe the dielectric response process in relaxor ferroelectrics should be also valid for relaxor ferroelectric thin films.…”

Section: Methodsmentioning

confidence: 93%

Dielectric properties of relaxor ferroelectric films

Duan

et al. 2005

Journal of Applied Physics

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Dielectric properties of the relaxor films are theoretically investigated with the Monte Carlo simulation. We find that the size effect on the dielectric susceptibility of films is neglectable while the influence of the surface layer of the film is overlooked. On the contrary, while the surface layer is explicitly considered, we observe a systematic increase of T m ͑the temperature at which the dielectric susceptibility reaches the maximum͒ and a systematic decrease of the maximum dielectric susceptibility as the film thickness decreases. An additional broadening of the transition region around T m and the frequency dispersion of the dielectric susceptibility above T m are also observed. The mechanism responsible for these phenomena is presented.

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High-Resolution Electron Microscopy on Epitaxial Pb(Mg_1/3Nb_2/3)O₃ Film Prepared by Sol-Gel Method

Cited by 20 publications

References 7 publications

Electron Microscopy Studies of Potassium Sodium Niobate Ceramics

Electron Microscopy Studies of Potassium Sodium Niobate Ceramics

Preferred Orientations for Sol-Gel Derived Plzt Thin Layers

Dielectric properties of relaxor ferroelectric films

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