High Resolution Dynamic R<sub>DS(on)</sub> Measurement of GaNFET using Active V<sub>DS(on)</sub> Measurement Clamp Circuit

Rahman, Arief Noor; Li, Mengyang; Tampubolon, Marojahan; Chiu, Huang‐Jen

doi:10.1109/wipdaasia.2019.8760329

2019 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) 2019

DOI: 10.1109/wipdaasia.2019.8760329

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High Resolution Dynamic R_DS(on) Measurement of GaNFET using Active V_DS(on) Measurement Clamp Circuit

Arief Noor Rahman

Mengyang Li

Marojahan Tampubolon

et al.

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High Resolution Dynamic R_DS(on) Measurement of GaNFET using Active V_DS(on) Measurement Clamp Circuit

Cited by 2 publications

References 4 publications

Methodology for Extracting Dynamic On-Resistance Testing Data in Gallium Nitride-Based Power Transistors

Methodology for Extracting Dynamic On-Resistance Testing Data in Gallium Nitride-Based Power Transistors

Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices

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High Resolution Dynamic RDS(on) Measurement of GaNFET using Active VDS(on) Measurement Clamp Circuit

Cited by 2 publications

References 4 publications

Methodology for Extracting Dynamic On-Resistance Testing Data in Gallium Nitride-Based Power Transistors

Methodology for Extracting Dynamic On-Resistance Testing Data in Gallium Nitride-Based Power Transistors

Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices

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High Resolution Dynamic R_DS(on) Measurement of GaNFET using Active V_DS(on) Measurement Clamp Circuit