Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices

Zhong, Rui; Wen, Huiqing

doi:10.23919/ipec-himeji2022-ecce53331.2022.9806866

2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia) 2022

DOI: 10.23919/ipec-himeji2022-ecce53331.2022.9806866

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Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices

Rui Zhong

Huiqing Wen

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Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices

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