High Reliability of High-Speed Vertical-Cavity Surface-Emitting Lasers with Silicone-Encapsulated Structure and Parallel Optical Transmitter Modules

Abstract

Reliability of both high-speed vertical-cavity surface-emitting lasers (VCSELs) with silicone-encapsulated structure and the parallel optical transmitter modules were investigated. Results of wear-out life tests indicated that the VCSEL with a silicone-encapsulated structure has the same lifetime as a bare-chip VCSEL, which was more than 106 h at the junction temperature of 90 °C. High reliability of the 20 Gbps × 12 channel on-board parallel optical transmitter modules in various test environments was also confirmed.