2010
DOI: 10.1016/j.jcrysgro.2009.10.041
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High-quality metamorphic compositionally graded InGaAs buffers

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Cited by 47 publications
(34 citation statements)
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“…Lee and Fitzgerald [11] demonstrated up to X In ¼ 0.35 In x Ga 1 À x As graded buffers on on-axis (0 0 1) GaAs substrates with threading dislocation densityo9.5 Â 10 4 cm À 2 with a grading rate of 0.51% strain/mm. In both of their experiments, the In x Ga 1 À x As was grown on on-axis substrates at high temperatures (700-725 1C) to prevent the formation of phase separated regions.…”
Section: Results For Ingaas/ingap Graded Buffersmentioning
confidence: 99%
“…Lee and Fitzgerald [11] demonstrated up to X In ¼ 0.35 In x Ga 1 À x As graded buffers on on-axis (0 0 1) GaAs substrates with threading dislocation densityo9.5 Â 10 4 cm À 2 with a grading rate of 0.51% strain/mm. In both of their experiments, the In x Ga 1 À x As was grown on on-axis substrates at high temperatures (700-725 1C) to prevent the formation of phase separated regions.…”
Section: Results For Ingaas/ingap Graded Buffersmentioning
confidence: 99%
“…When there is a 5% strain/expansion in the GaAs lattice parameter, the solubility of Bi increases by two orders of magnitude to about × . In practice, a larger substrate lattice parameter can be achieved through the use of a substrate such as InP or the use of graded or metamorphic buffer layers 56 . Note that we consider strains of up to 0.…”
Section: B Epitaxial Calculationsmentioning
confidence: 99%
“…Recent advancements in metamorphic growth with compositionally graded buffers now allow Al x In 1Àx P to be grown directly on GaAs substrates with high crystal quality over a wide range of compositions. 10 Here, we explore a set of Al x In 1Àx P samples spanning the direct-indirect crossover to obtain exact values for the crossover composition and energy. A set of bulk Al x In 1Àx P samples closely lattice matched to InGaAs graded buffer layers were grown on GaAs substrates using MOCVD.…”
mentioning
confidence: 99%