2010
DOI: 10.1088/0022-3727/43/5/055402
|View full text |Cite
|
Sign up to set email alerts
|

High quality ITO thin films grown by dc and RF sputtering without oxygen

Abstract: High quality indium tin oxide (ITO) thin films were grown without oxygen by both dc and RF magnetron sputtering techniques on glass substrates. The effects of substrate temperature, film thickness and sputtering method on the structural, electrical and optical properties of the as-grown films were investigated. The results showed that the substrate temperature had substantial effects on the film properties, in particular on the crystallization and resistivity. When the substrate temperature was increased to 15… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

4
131
0
1

Year Published

2010
2010
2023
2023

Publication Types

Select...
8
1
1

Relationship

0
10

Authors

Journals

citations
Cited by 275 publications
(146 citation statements)
references
References 37 publications
4
131
0
1
Order By: Relevance
“…The measured carrier mobility of the ITO granular film using Hall effect testing instrument is~0.23 cm 2 /Vs, very close to the reported value [25] but far lower than that of ITO continuous film (~10-70 cm 2 /Vs) [29,30]. The global carrier mobility for the ITO granular film reflects the average value throughout the film and is therefore significantly affected by interparticle transfer, surface scattering, and trapping.…”
Section: Characterization and Measurementssupporting
confidence: 76%
“…The measured carrier mobility of the ITO granular film using Hall effect testing instrument is~0.23 cm 2 /Vs, very close to the reported value [25] but far lower than that of ITO continuous film (~10-70 cm 2 /Vs) [29,30]. The global carrier mobility for the ITO granular film reflects the average value throughout the film and is therefore significantly affected by interparticle transfer, surface scattering, and trapping.…”
Section: Characterization and Measurementssupporting
confidence: 76%
“…32,33 After 4 h of annealing, however, the characteristic peaks of c-ITO (2θ = 30.5°and 2θ = 35.5°assigned to 222 and 400, respectively) were observed. 10,34 These peaks imply that the top ITO layer was successfully crystallized by the annealing process.…”
Section: Fabrication Of C-ito/metal Nw-gfrhybrimer Filmsmentioning
confidence: 98%
“…A similar mode profile can be seen from Figure 2D′ for the case of bulk ITO structure, which is a waveguide made of ITO on top of a SiO 2 substrate ( Figure 2D). Index modulation for bulk ITO can in principle be done via thermo-refractive effects, but the effect is rather slow (~ms); here the carrier concentration in ITO increases with annealing temperature [46,47]. A second mechanism for index tuning of ITO is a capacitive carrier modulation-based mechanism discussed above [3,10,14,15,21,26,27] Thus, for biasing purposes, a 5 nm gating oxide layer is included (for every mode considered for electrostatic consistency).…”
Section: Modal Tuning Propertiesmentioning
confidence: 99%