High Power Semiconductor Lasers for EDFA Pumping

Kasukawa, A.

doi:10.1016/b978-012225261-7/50005-1

Cited by 3 publications

(2 citation statements)

References 22 publications

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“…Usually, three major failure modes are considered as the driving mechanisms for sudden failures. Whereas catastrophic optical mirror damage (COMD) [11,12] is not observed anymore and packaginginduced failure (PIF) also has been suppressed or eliminated [13,14], most sudden failures are caused by a dislocation growth from the outside of the active region [15]. In the following, we shall assume that pump power drops instantaneously.…”

Section: Failure Scenariosmentioning

confidence: 99%

Investigation into the significance of failure rate calculations for erbium—doped fiber amplifiers in view of the reliability of communication networks

Rapp

2008

Trans Emerging Tel Tech

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SUMMARYThis paper deals with the impact of erbium-doped fiber amplifier (EDFAs) on the reliability of communication networks. It is shown that failure rates calculated for EDFAs have only limited significance in view of the reliability of the complete network. Standard amplifier setups using a single pump per stage are compared with setups making use of pump sharing. The analysis reveals that differences with respect to downtime and mean time to repair of networks using these types of amplifiers are much smaller than it is expected from the failure rate calculations. This is due to the fact that standard amplifiers can compensate the failure of an intermediate pump for several operating conditions by increasing the power emitted by the other pumps, whereas compensation capabilities of setups based on pump sharing are strongly constrained.

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Section: Failure Scenariosmentioning

confidence: 99%

Investigation into the significance of failure rate calculations for erbium—doped fiber amplifiers in view of the reliability of communication networks

Rapp

2008

Trans Emerging Tel Tech

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“…Traditionally, such optical communications equipment relies on some form of optical amplifier technology in order to achieve maximum performance and long haul capability. Current systems predominantly rely on erbium doped fiber amplifiers 1 and Raman amplifier technology where optical amplification is achieved though the use of relatively low power (~ 250 mW) single mode optical diodes.…”

Section: Introductionmentioning

confidence: 99%

<title>Failure mode analysis of high-power laser diodes</title>

Ahrens¹,

Jaques²,

Dutta³

et al. 2002

SPIE Proceedings

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In this paper, we present the results of a preliminary investigation on the reliability of high power optical diodes. Commercially available 970 nm optical diodes were subjected to various levels of stress, including: operating current, optical power and operating temperature. Optical diodes that failed during testing were subsequently analyzed using a variety of techniques, including: optical microscopy, scanning electron microscopy, electroluminescence, and near-field profiling. It has been observed that the major cause of optical failure can be attributed to damage on the emitting facet of the optical diodes. Preliminary evidence suggests that facet damage is a result of catastrophic optical damage.

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