2014
DOI: 10.1109/lpt.2014.2343260
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High-Photocurrent and Wide-Bandwidth UTC Photodiodes With Dipole-Doped Structure

Abstract: InP-based uni-traveling-carrier photodiodes (UTC-PDs) with novel dipole-doped structure to achieve high photocurrent as well as wide bandwidth are demonstrated in this work. The dipole-doped layers in combination with a 22-nm-thick undoped InGaAs setback layer were employed at the InGaAs/InP absorption and collection interface to reduce the current blocking effect. A high photocurrent of 160 mA with 1.9 GHz 3-dB bandwidth from a 70-µm -diameter top-illuminated UTC-PD is achieved. A large 3-dB bandwidth of 62.5… Show more

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Cited by 11 publications
(15 citation statements)
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“…A typical InP‐based UTC‐PD consists of a p‐type narrow‐bandgap InGaAs light absorption layer and an n‐type wide‐bandgap InP carrier collection layer . The abrupt energy barrier at InGaAs/InP interface blocking electron flow and causing a buildup of stored charge would degrade DC performance at high current densities and also limit the high‐speed performance of PD.…”
Section: Device Structure and Equivalent Circuit Modelmentioning
confidence: 99%
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“…A typical InP‐based UTC‐PD consists of a p‐type narrow‐bandgap InGaAs light absorption layer and an n‐type wide‐bandgap InP carrier collection layer . The abrupt energy barrier at InGaAs/InP interface blocking electron flow and causing a buildup of stored charge would degrade DC performance at high current densities and also limit the high‐speed performance of PD.…”
Section: Device Structure and Equivalent Circuit Modelmentioning
confidence: 99%
“…The abrupt energy barrier at InGaAs/InP interface blocking electron flow and causing a buildup of stored charge would degrade DC performance at high current densities and also limit the high‐speed performance of PD. To overcome this problem, a dipole‐doped structure, which consists of a p‐type doped 8‐nm InGaAs, a n‐type doped 8‐nm InP layer and a 22‐nm undoped InGaAs setback layer, was inserted between the InGaAs absorption layer and InP collection layer to suppress the current blocking effect . The epi‐layer structure could be found in Table .…”
Section: Device Structure and Equivalent Circuit Modelmentioning
confidence: 99%
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