Formation of pores on Si wafer as an effective approach
to enhance
the light absorption of Si is attractive for graphene (GR)-based-heterojunction
optoelectronic devices such as GR/porous Si (PSi) photodetectors (PDs),
but the misalignment at the GR/PSi interface limits further enhancement
of the PDs’ performance. Here, we first employ WS2 as an interfacial layer between GR and PSi to fabricate GR/WS2/PSi heterojunction PDs exhibiting a broad-band photoresponse
in the visible range, originating from the enlarged band gap of PSi
based on the quantum confinement effect. By the insertion of the WS2 interfacial layer, the PDs’ parameters including responsivity,
detectivity, and external quantum efficiency are greatly improved
under reverse bias due to the increased built-in field throughout
the device, resulting in better separation of the photoinduced electron–hole
pairs. In addition, the response time of the PDs shows a sharp decrease
in the GR/WS2/PSi structure compared to the GR/WS2/Si counterpart (102/228 → 2.46/1.16 μs for the rise/fall
times in the transient photocurrent curve). A 20% loss of the responsivity
value is observed after the stability of the PDs is tested during
2000 h in air, resulting from the passivation of WS2 for
the GR and PSi surfaces.