2008 20th International Symposium on Power Semiconductor Devices and IC's 2008
DOI: 10.1109/ispsd.2008.4538906
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High Performance Low-Voltage Power MOSFETs with Hybrid Waffle Layout Structure in a 0.25μ Standard CMOS Process

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Cited by 21 publications
(13 citation statements)
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“…This is then connected to higher level of metal by contacts and vias up to the top metal level. Figure 3.9 depicts the typical multi-fingers connection of the transistor array which not only reduces the gate resistance but it also reduces the junction capacitances [90,91].…”
Section: Power Transistor Layoutmentioning
confidence: 99%
“…This is then connected to higher level of metal by contacts and vias up to the top metal level. Figure 3.9 depicts the typical multi-fingers connection of the transistor array which not only reduces the gate resistance but it also reduces the junction capacitances [90,91].…”
Section: Power Transistor Layoutmentioning
confidence: 99%
“…The waffle layout structure is occupied by the inter-connection of metal rather than the active area which result in the turn on resistance of the power MOS to be reduced to a greater extent. Thus, for the same size of power MOS, waffle structure layout will yield a much smaller turn on resistance as compared to multi-figure layout [97]. However, the area occupied by waffle layout is much larger than the multi-finger structure and it requires special PDK to support which may not be practical in normal process.…”
Section: Layout Design Of Power Mosmentioning
confidence: 99%
“…Its presence can be explained due to the fact that power PMOS and NMOS has different current characteristic. If the offset voltage in the valley current sensing output is97 removed, the accuracy of the valley current sensing can yield > 97% accuracy for a load ranging from 25 to 535 mA.…”
mentioning
confidence: 99%
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“…However, a larger power transistor size consumes a larger silicon area and increases the gate driving losses which contributes to higher switching power losses. Hence, different layout techniques are discussed in [133][134][135] [136].…”
Section: Power Losses and Efficiencymentioning
confidence: 99%