2023
DOI: 10.1021/acsphotonics.3c01294
|View full text |Cite
|
Sign up to set email alerts
|

High-Performance Lead-Free Layered-Perovskite Photodetectors and Bipolar Transistors by Solvent Engineering

Jun Wu,
Yuchen Miao,
Xiaorong Qi
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(2 citation statements)
references
References 57 publications
0
2
0
Order By: Relevance
“…To achieve high D *, the dark current density ( J d ) and consequentially noise current ( i n ) should be reduced. The elements causing J d are still widely discussed; however, some of its underlying mechanisms such as thermal generation, charge injection, trap-assisted tunneling, and recombination have been identified to largely influence its value. Defects found in the bulk, at the surface, or interfaces of the active layer create defect states within the bandgap, which fuel such mechanisms, thereby increasing J d . Defects in the bulk have been attributed to Frenkel defects, dislocations, lattice strain, and migrating ions. Instead, dangling bonds from grain boundaries, anionic vacancies (especially iodine vacancies), and interfaces have been blamed for the surface contribution. , Energy level alignment was also shown to dominate the charge injection mechanism: a larger energy difference (Δ E ) between the anode and perovskite conduction band (CB) suppresses injection and tunneling. , …”
Section: Introductionmentioning
confidence: 99%
“…To achieve high D *, the dark current density ( J d ) and consequentially noise current ( i n ) should be reduced. The elements causing J d are still widely discussed; however, some of its underlying mechanisms such as thermal generation, charge injection, trap-assisted tunneling, and recombination have been identified to largely influence its value. Defects found in the bulk, at the surface, or interfaces of the active layer create defect states within the bandgap, which fuel such mechanisms, thereby increasing J d . Defects in the bulk have been attributed to Frenkel defects, dislocations, lattice strain, and migrating ions. Instead, dangling bonds from grain boundaries, anionic vacancies (especially iodine vacancies), and interfaces have been blamed for the surface contribution. , Energy level alignment was also shown to dominate the charge injection mechanism: a larger energy difference (Δ E ) between the anode and perovskite conduction band (CB) suppresses injection and tunneling. , …”
Section: Introductionmentioning
confidence: 99%
“…22 Among them, tin (Sn) and germanium (Ge) elements are located in the same group as lead (Pb) and have a +2 valence state. [23][24][25] After about ten years of research, the device performance of Snbased perovskites has been greatly improved, especially in the case of field-effect transistors composed of Sn-based perovskites. The field-effect mobility for (C 6 H 5 C 2 H 4 NH 3 , PEA) 2 SnI 4 perovskite field-effect transistors have increased from 0.62 to 15 cm 2 V À1 s À1 .…”
Section: Introductionmentioning
confidence: 99%