2005
DOI: 10.1109/tpwrd.2005.852367
|View full text |Cite
|
Sign up to set email alerts
|

High Impedance Fault Detection Based on Wavelet Transform and Statistical Pattern Recognition

Abstract: A novel method for high impedance fault (HIF) detection based on pattern recognition systems is presented in this paper. Using this method, HIFs can be discriminated from insulator leakage current (ILC) and transients such as capacitor switching, load switching (high/low voltage), ground fault, inrush current and no load line switching. Wavelet transform is used for the decomposition of signals and feature extraction, feature selection is done by principal component analysis and Bayes classifier is used for cl… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
86
0
9

Year Published

2005
2005
2021
2021

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 192 publications
(96 citation statements)
references
References 19 publications
0
86
0
9
Order By: Relevance
“…[30] Redial 97.3 % NA Ref. [5] Redial 96.0 % NA Ref. [12] Redial 100 % NA used as learning algorithm.…”
Section: A Results Ann Classifier Using Input As St Featurementioning
confidence: 99%
See 2 more Smart Citations
“…[30] Redial 97.3 % NA Ref. [5] Redial 96.0 % NA Ref. [12] Redial 100 % NA used as learning algorithm.…”
Section: A Results Ann Classifier Using Input As St Featurementioning
confidence: 99%
“…Table 9 demonstrates the comparison between the proposed stransform based technique, and existing/proposed HIF detection methods. The information related to SNR 30 dB case are not available in the reference paper [5,12,29,30] and is shown as NA (not available) in Table 9. The table clearly reveals an inherent performance of the technique to detect high impedance fault under noisy condition…”
Section: B Results Svm Classifier Using Input As St Featurementioning
confidence: 99%
See 1 more Smart Citation
“…Wavelet transforms are applied in [12] [14] [15] [16] [17] to detect HIF cases and distinguish the multilevel characteristics in order to identify events. However, these applications used transient phase current data.…”
Section: Introductionmentioning
confidence: 99%
“…If an X value is substituted, the weights will return the overall change in bus power. The final linear model for bus 1 is shown in Equation (15) and expanded generically in Equation (16). R code was used to carry out this analysis.…”
mentioning
confidence: 99%