2009
DOI: 10.1007/s11434-009-0606-4
|View full text |Cite
|
Sign up to set email alerts
|

High frequency modeling for quantum-well laser diodes

Abstract: Citation: Gao J J. High frequency modeling for quantum-well laser diodes.High frequency modeling of quantum-well (QW) laser diodes for optoelectronic integrated circuit (OEIC) design is discussed in this paper. Modeling of the intrinsic device and the extrinsic components is discussed by accounting for important physical effects at both dc and high frequency. The concepts of equivalent circuits representing both intrinsic and extrinsic components in a QW laser diode are analyzed to obtain a physics-based high … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
10
0
1

Year Published

2010
2010
2018
2018

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 6 publications
(11 citation statements)
references
References 13 publications
0
10
0
1
Order By: Relevance
“…(iii) The parasitic parameters of the package network and the chip can be obtained by comparing with the results of packaged PD, and then with the equivalent circuit model of the whole PD can be established, consequently the comprehensive optimum design of the PD chip and its microwave packaging can be proceeded [16,17].…”
Section: Discussionmentioning
confidence: 99%
“…(iii) The parasitic parameters of the package network and the chip can be obtained by comparing with the results of packaged PD, and then with the equivalent circuit model of the whole PD can be established, consequently the comprehensive optimum design of the PD chip and its microwave packaging can be proceeded [16,17].…”
Section: Discussionmentioning
confidence: 99%
“…The value of C dd can be determined using the procedure as follows . Setting initial value of C dd . Calculating the error as a function of the reflection coefficient at port 2: normalε=1N1i=0N1S22mS22s2 where ε is the error function criterion, superscript s denotes the simulated S‐parameter, m denotes the measured S ‐parameter, and i = (0… N−1) is the number of sampling points . If ε > ε 0 (ε 0 is the error target, normally 0.1%), the value of C dd needs to be updated to reduce ε. If ε < ε 0 is achieved, the value of C dd can be confirmed. …”
Section: Parameter Extractionmentioning
confidence: 99%
“…An accurate model parameter extraction technique of UTC‐PD is important for understanding of the device physical mechanisms and improving the device performances . Development of the equivalent circuit models of UTC‐PDs is also essential as it allows the existing well‐developed circuit simulation software to be utilized in the design and analysis of optoelectronic circuits . For high‐photocurrent and high‐speed photodiodes, various modeling methods, such as physics‐driven modeling, analytical modeling, empirical modeling and equivalent circuit modeling, have been investigated (especially for PIN‐PDs).…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations