2010
DOI: 10.1103/physrevlett.105.215504
|View full text |Cite
|
Sign up to set email alerts
|

High-Fidelity Conformation of Graphene toSiO2Topographic Features

Abstract: High-resolution noncontact atomic force microscopy of SiO2 reveals previously unresolved roughness at the few-nm length scale, and scanning tunneling microscopy of graphene on SiO2 shows graphene to be slightly smoother than the supporting SiO2 substrate. A quantitative energetic analysis explains the observed roughness of graphene on SiO2 as extrinsic, and a natural result of highly conformal adhesion. Graphene conforms to the substrate down to the smallest features with nearly 99% fidelity, indicating confor… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

5
102
0

Year Published

2011
2011
2019
2019

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 126 publications
(107 citation statements)
references
References 23 publications
5
102
0
Order By: Relevance
“…The measured root-mean-square (RMS) surface roughness of graphene/SiO is 1.5 -5.0 Å (∼ 1.5 Å, 60 nm ×60 nm [56]; ∼ 1.5 Å, 30 nm ×30 nm [58]; ∼ 1.9 Å, 250 nm ×200 nm [161]; ∼ 5.0 Å, 10 nm ×10 nm [162]; ∼ 3.5 Å, 195 nm ×178 nm [164]; ∼ 2.2 Å, 100 nm ×100 nm [165]). In contrast, the RMS surface roughness of graphene/BN is 0.02-0.30 Å (0.02-0.17 Å, 20 nm ×20 nm [57]; ∼ 0.30 Å, 100 nm ×100 nm [165]).…”
Section: Graphene On Silicon Carbidementioning
confidence: 99%
See 1 more Smart Citation
“…The measured root-mean-square (RMS) surface roughness of graphene/SiO is 1.5 -5.0 Å (∼ 1.5 Å, 60 nm ×60 nm [56]; ∼ 1.5 Å, 30 nm ×30 nm [58]; ∼ 1.9 Å, 250 nm ×200 nm [161]; ∼ 5.0 Å, 10 nm ×10 nm [162]; ∼ 3.5 Å, 195 nm ×178 nm [164]; ∼ 2.2 Å, 100 nm ×100 nm [165]). In contrast, the RMS surface roughness of graphene/BN is 0.02-0.30 Å (0.02-0.17 Å, 20 nm ×20 nm [57]; ∼ 0.30 Å, 100 nm ×100 nm [165]).…”
Section: Graphene On Silicon Carbidementioning
confidence: 99%
“…High resolution STM images have been achieved for graphene on SiO [56,[161][162][163][164][165] as well as on BN [57,165]. The measured root-mean-square (RMS) surface roughness of graphene/SiO is 1.5 -5.0 Å (∼ 1.5 Å, 60 nm ×60 nm [56]; ∼ 1.5 Å, 30 nm ×30 nm [58]; ∼ 1.9 Å, 250 nm ×200 nm [161]; ∼ 5.0 Å, 10 nm ×10 nm [162]; ∼ 3.5 Å, 195 nm ×178 nm [164]; ∼ 2.2 Å, 100 nm ×100 nm [165]).…”
Section: Graphene On Silicon Carbidementioning
confidence: 99%
“…It is worth mentioning that irrespective of the surface type, values obtained for the adhesion energies are sufficiently exceeding the elastic energy stored in graphene (∼0.8-2.6 meV/C). 18,20 This means that the interaction energy between graphene and SiO 2 is large enough to overcome the energy needed for graphene to follow the SiO 2 morphology. Therefore, our results confirm previous estimations regarding the possibility of graphene-SiO 2 conformation.…”
Section: Graphene Adhesion On Sio2mentioning
confidence: 99%
“…As follows from experimental studies, the structure of graphene supported on amorphous SiO 2 is highly corrugated owing to highfidelity conformation. 17,18,20 The assumed invariability of graphene is resulting from the employed theoretical approach. Indeed, the supercell used in our study is too small in lateral directions to reveal corrugations of graphene caused by the irregularity of the substrate.…”
Section: B Geometry Of the Graphene-sio2 Interfacementioning
confidence: 99%
See 1 more Smart Citation