“…The drawbacks of this approach are that the Ce02 is subject to cracking, which degrades the effect of the buffer layer, and that the both of CeOz and,YSZ have to be deposited using PLD, same as the YBCO, which makes the process sequential and lengthy. It has been reported that the critical current density of an YBCO composite tape) produced by pulsed laser deposition (PLD) of YBCO film on a cube-textured NiO,j previously fabricated by SOB of a cube-textured Ni, was between 4 xl04 Acm-2 and 6 xl0 4 i Acm· 2 (at 17K, and OT) [6]. This value is approximately two orders of magnitude lower'; than the critical current density of an YBCO/Ce02INi tape where the Ce02 buffer layer is) produced by PLD using ion beam assisted deposition (lEAD) on randomly-oriented Ni, by PLD on RABiTS Ni [1,7].…”