High-Accuracy Wide-Range Measurement Method for Determination of Complex Permittivity in Reentrant Cavity: Part A --- Theoretical Analysis of the Method

Kaczkowski, A.; Milewski, A.

doi:10.1109/tmtt.1980.1130045

Cited by 34 publications

(17 citation statements)

References 3 publications

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“…In the frequency range 50 MHz-2 GHz a re-entrant cavity method can be employed [51,54,55] to evaluate the dielectric properties. Both TM 010 and re-entrant cavities are closed with a lid after insertion of the samples.…”

Section: Tm 0n0 Mode and Re-entrant Cavity Methodsmentioning

confidence: 99%

Measurement of Microwave Dielectric Properties and Factors Affecting Them

Sebastian

2008

Dielectric Materials for Wireless Communication

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Section: Tm 0n0 Mode and Re-entrant Cavity Methodsmentioning

confidence: 99%

Measurement of Microwave Dielectric Properties and Factors Affecting Them

Sebastian

2008

Dielectric Materials for Wireless Communication

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“…The first is a lumped-circuit approximation [36,37]. The other approach is a rigorous modematching technique [38][39][40]. The full-field model is given in reference [38].…”

Section: Almentioning

confidence: 99%

Dielectric and conductor-loss characterization and measurements on electronic packaging materials

Baker–Jarvis¹,

Janezic²,

Riddle³

et al. 2001

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“…Therefore, dielectric properties were measured using a doubly reentrant cavity at lower frequencies. This method (16)(17)(18)(19)(20) permits the evaluation of permittivity and dielectric loss over a wide range of frequencies (100 MHz to 1 GHz) using relatively small, cylindrically shaped specimens. Accurate dielectric loss data can be obtained for low-to medium-loss materials (tan &10\ to 10\).…”

Section: Red-black Single Crystals Of Bamentioning

confidence: 99%