High-accuracy detector calibration at the PTB four-crystal monochromator beamline

Krumrey, Michael; Ulm, G.

doi:10.1016/s0168-9002(01)00598-8

Cited by 192 publications

(174 citation statements)

References 9 publications

Supporting

Mentioning

173

Contrasting

Unclassified

Order By: Relevance

“…0.55 mL of 29 Si-TEOS was injected into the cyclohexane phase and it was allowed to react for 20 h. Finally cyclohexane was removed under reduced pressure. Germany) [12,13]. The sample-to-detector distance was 2.2 m, the X-ray energy was set to 8 keV, and the sample was filled into borosilicate glass capillary with 1.0 mm nominal diameter (Müller & Müller OHG, Berlin, Germany).…”

Section: Preparation Of 29 Si-silica Npsmentioning

confidence: 99%

Total synthesis of isotopically enriched Si-29 silica NPs as potential spikes for isotope dilution quantification of natural silica NPs

Pálmai

Szalay

Bartczak³

et al. 2015

Journal of Colloid and Interface Science

View full text Add to dashboard Cite

A new method was developed for the preparation of highly monodisperse isotopically enriched Si-29 silica nanoparticles ( 29 Si-silica NPs) with the purpose of using them as spikes for isotope dilution mass spectrometry (IDMS) quantification of silica NPs with natural isotopic distribution. Si-29 tetraethyl orthosilicate ( 29 Si-TEOS), the silica precursor was prepared in two steps starting from elementary silicon-29 pellets. In the first step Si-29 silicon tetrachloride ( 29 SiCl 4 ) was prepared by heating elementary silicon-29 in chlorine gas stream. By using a multistep cooling system and the dilution of the volatile and moisturesensitive 29 SiCl 4 in carbon tetrachloride as inert medium we managed to reduce product loss caused by evaporation. 29 Si-TEOS was obtained by treating 29 SiCl 4 with absolute ethanol.Structural characterisation of 29 Si-TEOS was performed by using 1 H and 13 C nuclear magnetic resonance (NMR) spectroscopy and Fourier-transform infrared (FTIR) spectroscopy. For the NP preparation, a basic amino acid catalysis route was used and the resulting NPs were analysed using transmission electron microscopy (TEM), small angle Xray scattering (SAXS), dynamic light scattering (DLS) and zeta potential measurements.

show abstract

Section: Preparation Of 29 Si-silica Npsmentioning

confidence: 99%

Total synthesis of isotopically enriched Si-29 silica NPs as potential spikes for isotope dilution quantification of natural silica NPs

Pálmai

Szalay

Bartczak³

et al. 2015

Journal of Colloid and Interface Science

View full text Add to dashboard Cite

show abstract

“…The data have been obtained with a relative standard uncertainty of 5% at the four crystal x-ray monochromator beamline of PTB at BESSY II. 35 We compared the X-GMD signal current measured with a Keithley 617 picoamperemeter to the output of a calibrated semiconductor photodiode as secondary standard for radiant power, traceable to a cryogenic radiometer as the primary detector standard. 17 As expected and indicated by the prominent L edges around 5 keV, the calibration curves clearly follow the xenon photoionization cross section ͓see Eq.…”

Section: Gmds For Hard X-ray Felsmentioning

confidence: 99%

Gas detectors for x-ray lasers

Tiedtke¹,

Feldhaus²,

Hahn³

et al. 2008

Journal of Applied Physics

Self Cite

164

128

View full text Add to dashboard Cite

We have developed different types of photodetectors that are based on the photoionization of a gas at a low target density. The almost transparent devices were optimized and tested for online photon diagnostics at current and future x-ray free-electron laser facilities on a shot-to-shot basis with a temporal resolution of better than 100 ns. Characterization and calibration measurements were performed in the laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY II in Berlin. As a result, measurement uncertainties of better than 10% for the photon-pulse energy and below 20 m for the photon-beam position were achieved at the Free-electron LASer in Hamburg ͑FLASH͒. An upgrade for the detection of hard x-rays was tested at the Sub-Picosecond Photon Source in Stanford.

show abstract

“…The detector was calibrated and characterized by PTB, so that its response functions and detection efficiency are well known. 11 The incidence photon flux was determined by a calibrated photo diode. To determine the net fluorescence count rates, measured spectra for each angle of incidence were deconvoluted and fitted, taking into account the detector response functions 12 as well as modeled background contributions from Bremsstrahlung and resonant Raman scattering.…”

Section: Figmentioning

confidence: 99%

Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films

Streeck

Brunken

Gerlach

et al. 2013

Applied Physics Letters

View full text Add to dashboard Cite

Development of highly efficient thin film solar cells involves band gap engineering by tuning their elemental composition with depth. Here we show that grazing incidence X-ray fluorescence (GIXRF) analysis using monochromatic synchrotron radiation and well-characterized instrumentation is suitable for a non-destructive and reference-free analysis of compositional depth profiles in thin films. Variation of the incidence angle provides quantitative access to the in-depth distribution of the elements, which are retrieved from measured fluorescence intensities by modeling parameterized gradients and fitting calculated to measured fluorescence intensities. Our results show that double Ga gradients in Cu(In1−x,Gax)Se2 can be resolved by GIXRF.

show abstract

High-accuracy detector calibration at the PTB four-crystal monochromator beamline

Cited by 192 publications

References 9 publications

Total synthesis of isotopically enriched Si-29 silica NPs as potential spikes for isotope dilution quantification of natural silica NPs

Total synthesis of isotopically enriched Si-29 silica NPs as potential spikes for isotope dilution quantification of natural silica NPs

Gas detectors for x-ray lasers

Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films

Contact Info

Product

Resources

About