The area fraction of tie molecules at the crystal-amorphous interface, amorphous phase dynamics, average crystal strength against stem sliding, and crack growth tortuosity concepts have been used simultaneously, for the first time, to develop a model for predicting the environmental stress cracking resistance of semicrystalline polymers. The model is based on the analogy of crack growth through the amorphous phase of semicrystalline polymers in a harsh environment at adhesive polymersubstrate interfaces. The model variable consists of the practical work of crack growth (G c ) times the crack growth path tortuosity (C) and correlates very well with the time to failure in the full notch creep test (FNCT) through a sigmoidal-type equation:, where a (3386), b (0.16), and c (0.006) are constants (r 2 ¼ 0.999). G c is calculated by multiplication of the area fraction of tie molecules at the crystal-amorphous interface, the amorphous phase loss factor value at À25C, and the sample storage shear modulus at the test temperature, whereas C is estimated as the product of the sample molecular weight and its distribution. The application of the Kendall rank correlation coefficient test as a primitive gross criterion of comparison among the proposed correlations also shows reasonable values of the rank correlation coefficient (0.891) and probability (0.000) for the new model. In other words, a point-to-point increasing or descending trend among the experimentally found data is ignored in comparison with the sound physical basis of the correlation toward the development of a comprehensive model.