2011
DOI: 10.1016/j.jcrysgro.2011.09.037
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Heteroepitaxial structure of Zn atoms deposit on graphene, Si (001) and graphene/Si (001) substrates for ZnO nanostructure growth

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Cited by 2 publications
(3 citation statements)
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“…The advantage of the PDF is that it allows studying both the local and the medium-range structure of disordered and crystalline materials . Furthermore, it is worth noting that the application of PDF technique to the characterization of thin films is quite original with only a few studies reported so far. In the case of annealed thin films, a refinement of the full X-ray diffraction patterns was performed that allowed a precise determination of the unit cell parameters, an accurate analysis of crystallite size and preferred orientation effects, and, in some cases, a quantitative phase analysis. For thin films, it must be remembered that the crystallite size is often an anisotropic quantity with a size along the surface normal much larger than the size in the plane of the film.…”
Section: Resultsmentioning
confidence: 99%
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“…The advantage of the PDF is that it allows studying both the local and the medium-range structure of disordered and crystalline materials . Furthermore, it is worth noting that the application of PDF technique to the characterization of thin films is quite original with only a few studies reported so far. In the case of annealed thin films, a refinement of the full X-ray diffraction patterns was performed that allowed a precise determination of the unit cell parameters, an accurate analysis of crystallite size and preferred orientation effects, and, in some cases, a quantitative phase analysis. For thin films, it must be remembered that the crystallite size is often an anisotropic quantity with a size along the surface normal much larger than the size in the plane of the film.…”
Section: Resultsmentioning
confidence: 99%
“…In the case of as-deposited thin films, the pair distribution function method was applied giving insight into the nanostructures present. It is worth mentioning that the application of this method to the structural analysis of thin films is quite original. For annealed films displaying a polycrystalline surface, the Le Bail method was applied for a precise determination of the unit cell parameters; in some cases, the Rietveld method including a structural model could have been applied. A quantitative crystalline microstructure analysis based on the integral breadth method was also performed.…”
Section: Introductionmentioning
confidence: 99%
“…It has the potential for application in optoelectronics, energy storage, solar cells and so forth [12][13][14][15][16][17][18][19][20]. Recently, much attention has been on ZnO low dimensional structures such as nanowires (1D) and nanowallls (2D) nanostructures, which can be grown into a three dimensional (3D) architectures [21][22][23][24][25][26][27][28][29][30][31]. It is also possible to grow nanowalls, 2D structures, by techniques similar to 1D nanowires.…”
Section: Introductionmentioning
confidence: 99%