2013
DOI: 10.1038/srep03514
|View full text |Cite
|
Sign up to set email alerts
|

Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution

Abstract: Scanning Electron Microscopy (SEM) has long been the standard in imaging the sub-micrometer surface ultrastructure of both hard and soft materials. In the case of biological samples, it has provided great insights into their physical architecture. However, three of the fundamental challenges in the SEM imaging of soft materials are that of limited imaging resolution at high magnification, charging caused by the insulating properties of most biological samples and the loss of subtle surface features by heavy me… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

3
141
0

Year Published

2015
2015
2020
2020

Publication Types

Select...
4
2
1

Relationship

1
6

Authors

Journals

citations
Cited by 152 publications
(144 citation statements)
references
References 38 publications
3
141
0
Order By: Relevance
“…This is only briefly discussed here for the sake of completeness; it is more thoroughly described by Joens et al (2013). The fact that minerals appear rounded in Pt-coated samples can be attributed to preferential Pt accumulations at exposed structures such as edges and tips, likely caused by charge-effects during the sputter-coating process.…”
Section: Surface Alterations Related To Sputter Coatingmentioning
confidence: 97%
See 1 more Smart Citation
“…This is only briefly discussed here for the sake of completeness; it is more thoroughly described by Joens et al (2013). The fact that minerals appear rounded in Pt-coated samples can be attributed to preferential Pt accumulations at exposed structures such as edges and tips, likely caused by charge-effects during the sputter-coating process.…”
Section: Surface Alterations Related To Sputter Coatingmentioning
confidence: 97%
“…Another important feature is the fact that an electron flood gun can be used for charge compensation, which allows for the analysis of nonconductive samples. In this way, uncoated samples may be imaged without charging artifacts (Joens et al 2013). Resin embeddingSamples of a 3-week-old BoFeN1 culture were embedded in Spurr's resin and GMA resin.Samples were taken under anoxic conditions and washed twice with Fe-free culture medium, which included centrifugation, in order to remove potentially remaining Fe 2+ ions.…”
mentioning
confidence: 99%
“…Besides that, when the surface of the sample is bombarded by He + , the penetration of the beam is smaller, when compared to an electron beam accelerated to 30 kV, improving the resolution (Chen et al, 2011). The secondary electron yield is much higher than in SEM, giving to the images a better signal-to-noise ratio (Inai et al, 2007;Joens et al, 2013). Additionally, there is no need for metal coating of the samples, due to the unique charge compensation mechanism in HIM (Joy, 2013, Hlawacek et al, 2014.…”
Section: Introductionmentioning
confidence: 96%
“…The latter is very different from SEM and important to reach the estimated resolution of 0.35 nm. The gas field ionization source has ultra-high brightness, and a very small beam defining aperture may be used, minimizing spherical and chromatic aberrations and resulting in higher depth of field and a estimated resolution of 0.35 nm (Joy, 2013;Hlawacek et al, 2014;Joens et al, 2013). Besides that, when the surface of the sample is bombarded by He + , the penetration of the beam is smaller, when compared to an electron beam accelerated to 30 kV, improving the resolution (Chen et al, 2011).…”
Section: Introductionmentioning
confidence: 97%
See 1 more Smart Citation