Heavy Ion Nuclear Reaction Impact on SEE Testing: From Standard to Ultra-high Energies

Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies

“…The first is the one with a Z value around 14 (that of the target material, silicon) and an LET distribution reaching relatively large values of ∼10 MeV cm 2 /mg for the target-like fragments, thus near their energy deposition Bragg peak, highlighting their relatively low energy. In contrast, the second distribution, extending up to the projectile Z value, corresponds to the projectile-like fragments, with energies per nucleon similar to those of the projectile itself, as further shown and discussed in [17].…”

“…Previous works have shown that the approach of relying on the LET and device dimensions might not be accurate enough [14] and more parameters play a role in the resulting upset number than the LET value of a particle, such as incident particle energy and species [15]- [17]. Moreover, a discrepancy has been observed, especially for low LET ions below the LET threshold, caused by nuclear interactions, which contribute to the SEE cross section of a device [18].…”

“…These electronic components are smaller than in the past, more sensitive, and with increasingly complex structures [23]. All such complexities are removed when a UHE ion beam, for example, 208 Pb at 150 GeV/n [10]- [12], [17], is employed. Moreover, 3-D structures and stacked boards [10] can also be exposed to such a beam, as long as the beam does not experience high fragmentation and loss of intensity.…”

Multiscale, Multiphysics Modeling and Simulation of Single-Event Effects in Digital Electronics: From Particles to Systems

“…The produced fragments extend from proton or neutron to the nucleus of the target atom; they can in their turn directly ionize matter like any charged particle (previous case). It is important to note that nuclear reactions produced by high-energy ions are rare compared to ion-electron interactions, yet they hold significance in specific cases as explained in [31,32,33]. These nuclear reactions yield one or multiple secondary ionizing particles with significantly different electronic stopping power (see below) compared to the primary incident particle.…”

Fragmented High-Energy Heavy-Ion Beams for Electronics Testing

“…In [11], different nuclear physics models are compared in terms of VHE ion fragmentation and related energy deposition. In [12]- [14], Monte Carlo codes are used in combination with experimental data to estimate the nuclear reaction contribution to heavy ion SEEs in space. Likewise, the effect of delta rays on the deposited energy by UHE ions in relatively large (hundreds of μm) sensitive volumes is covered both experimentally and through simulation in [15] and [16].…”