Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp

Fontana, Andrés; Pazos, Sebastián; Aguirre, Fernando; Palumbo, F.; Vega, Nahuel; Müller, N.; Fournière, Emmanuel M. de la; Debray, M. E.

doi:10.1109/sbcci.2018.8533232

Cited by 1 publication

(2 citation statements)

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“…Therefore, extremely low heavy ion beam currents down to hundred ions/s can be accurately controlled, allowing to perform SEE studies in electronic devices. For further detail regarding the facility, the reader is referred to previous work by the group [26], [27].…”

Section: Methodsmentioning

confidence: 99%

“…Experimental evaluation of SEE in ICs under heavy-ion irradiation can be performed in a handful of facilities around the world [8], [21], [26]. Such experiments provide information regarding the sensitivity of a given circuit against SEE, in working conditions that well reproduce those expected for a system that performs in a space environment, including the possible effects of physical implementations on the ASET response.…”

Section: Analogmentioning

confidence: 99%

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Pulse Quenching and Charge-Sharing Effects on Heavy-Ion Microbeam Induced ASET in a Full-Custom CMOS OpAmp

Fontana

Pazos

Aguirre

et al. 2019

IEEE Trans. Nucl. Sci.

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In this work, charge sharing effects on Analog Single Event Transients are experimentally observed in a fully-custom designed, 180nm CMOS Operational Amplifier by means of a heavy-ion microbeam. Sensitive nodes of the differential stage showed bipolar output transients that cannot be explained by single node collection for the closed loop characteristics of the circuit under test. Layout of these transistors are consistent with charge sharing effects due to deposited charge diffusion. Implementation of linear modeling and simulations of multiple node collection between paired transistors of the input stage showed great coincidence with the obtained experimental waveforms, shaped as bipolar, quenched pulses. These effects are also observed due to dummy transistors placed in the layout.A simple parametrization at the simulation level is proposed to reproduce the observed experimental waveforms. Results indicate that charge-sharing effects should be taken into account during simulation-based sensitivity evaluation of analog circuits, as pulse quenching can alter the obtained results, and linear modeling is a simple approach to emulate simultaneous charge collection in multiple nodes by applying superposition principles, with aims of hardening a design.

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Section: Methodsmentioning

confidence: 99%