2011
DOI: 10.1016/j.actamat.2011.03.052
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Heat explosion approach to radiofrequency heating of a conductor film on silicon substrate: Application for silicide film formation

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Cited by 3 publications
(4 citation statements)
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“…3(b, c), exhibit step functions of the chemistry changes across the interfaces, illustrating that no intermixing of Ta and Si occurred between α-Ta lm and Si substrate. With respect to α-Ta lm grown at 500 o C, similar HAADF-STEM micrograph and EDS elemental of Si and Ta maps studies also show there is no evidence of Ta diffusing into the Si substrate, which is different from previous studies [13][14][15] . This result suggests the TiN x buffer layer are thermodynamically stable and compact, and therefore could prevent intermixing of Ta and Si between α-Ta lm and Si substrate under high substrate temperature.…”
Section: Resultscontrasting
confidence: 71%
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“…3(b, c), exhibit step functions of the chemistry changes across the interfaces, illustrating that no intermixing of Ta and Si occurred between α-Ta lm and Si substrate. With respect to α-Ta lm grown at 500 o C, similar HAADF-STEM micrograph and EDS elemental of Si and Ta maps studies also show there is no evidence of Ta diffusing into the Si substrate, which is different from previous studies [13][14][15] . This result suggests the TiN x buffer layer are thermodynamically stable and compact, and therefore could prevent intermixing of Ta and Si between α-Ta lm and Si substrate under high substrate temperature.…”
Section: Resultscontrasting
confidence: 71%
“…The obtainment of pure α-Ta lm which is easily formed at high temperature deposited on Si substrate without inner-diffusion interface is very limited, partially because of the obstacle that Ta is highly reactive to the heating Si substrate [13][14][15] . Although it has been reported that the α-Ta lm are deposited on Si substrate at room temperature (RT) successfully by using several strategies such as optimizing the sputtering conditions and adding under layers [16][17][18][19][20][21][22][23][24][25][26][27] .…”
Section: Introductionmentioning
confidence: 99%
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“…The homogeneity of the field strength is hard to predict, as shape and electrical characteristics of both antenna and substrate have an influence on this para meter. In one earlier 27 MHz study, the substrate was completely enclosed by an antenna, which results in large differences in field strength between edge and centre of the substrate [23].…”
Section: Introductionmentioning
confidence: 99%