Hardware-software system for automation of characteristics measurement of SOI CMOS VLSI elements under extreme high temperature conditions (up to 300°C)

Ismail-zade, Mamed R.; Romanov, A. Yu.; Kuzin, Egor Y.; Danykin, Vladimir S.; Chetverikov, Igor A.

doi:10.1109/eiconrus.2017.7910582

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Hardware-software system for automation of characteristics measurement of SOI CMOS VLSI elements under extreme high temperature conditions (up to 300°C)

Cited by 3 publications

References 12 publications

Prediction of High-Temperature Operation (up to +300°C) of Reference Voltage Source Built with Temperature-Tolerant Production Technology

Prediction of High-Temperature Operation (up to +300°C) of Reference Voltage Source Built with Temperature-Tolerant Production Technology

SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From −200 °C to +300 °C)

Compact Device Models for BiCMOS VLSIs Simulation in the Extended Temperature Range (from -200°C to +300°C)

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