We present a detailed study of the electronic structure and band alignment in LaAlO 3 /SrTiO 3 oxide heterostructures by hard x-ray photoelectron spectroscopy. Our spectroscopic measurements find no evidence for the strong potential gradient within the polar LaAlO 3 film predicted by band theory. Due to the high interface sensitivity of the method, we are further able to determine the valence band offset between the LaAlO 3 film and the SrTiO 3 substrate, which is found to be independent of the number of LAO overlayers. Finally, we discuss several explanations for the apparent absence of the built-in field in ex situ prepared LaAlO 3 /SrTiO 3 heterostructures.