Handling Unknown with Blend of Scan and Scan Compression

Shantagiri, Pralhadrao V.; Kapur, R.

doi:10.1007/s10836-018-5717-x

Cited by 2 publications

(4 citation statements)

References 40 publications

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“… Scan synthesis and patterns generation for both scan compression and ‘New Scan Compression’ method [24] …”

Section: New Scan Compression Architecturementioning

confidence: 99%

“…As load modes are limited, some detectable faults in scan mode cannot be detected in this architecture. In [24], broadcasting-based scan compression architecture is proposed based on the capture-X analysis. It showed TDV could be improved by excluding SFFs capturing Xs from the compression architecture and placing them in an external scan chain.…”

Section: Broadcast-based Scan Compression Architecturementioning

confidence: 99%

“…F I G U R E 7 Scan synthesis and patterns generation for both scan compression and 'New Scan Compression' method [24] F I G U R E 6 The length of the decompressor register and the longest internal scan chain length…”

Section: The Flow Of Execution Of New Scan Compression' Architecturementioning

confidence: 99%

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New scan compression approach to reduce the test data volume

Shantagiri

Kapur

Shastry

2021

IET Computers & Digital Tech

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The test data volume (TDV) increases with increased target compression in scan compression and adds to the test cost. Increased TDV is the result of a dependency across scan flip‐flops (SFFs) that resulted from compression architecture, which is absent in scan mode. The SFFs have uncompressible values logic‐0 and logic‐1 in many or most of the patterns contribute to the TDV. In the proposed new scan compression (NSC) architecture, SFFs are analysed from Automatic Test Pattern Generation (ATPG) patterns generated in a scan mode. The identification of SFFs to be moved out of the compression architecture is carried out based on the NSC. The method includes a ranking of SFFs based on the specified values present in the test patterns. The SFFs having higher specified values are moved out of the compression architecture and placed in the outside scan chain. The NSC is the combination of scan compression and scan mode. This method decides the percentage (%) of SFFs to be moved out of compression architecture and is less than 0.5% of the total SFFs present in the design to achieve a better result. The NSC reduces dependencies across the SFFs present in the test compression architecture. It reduces the TDV and test application time. The results show a significant reduction in the TDV up to 78.14% for the same test coverage.

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“… Scan synthesis and patterns generation for both scan compression and ‘New Scan Compression’ method [24] …”

Section: New Scan Compression Architecturementioning

confidence: 99%

Section: Broadcast-based Scan Compression Architecturementioning

confidence: 99%

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New scan compression approach to reduce the test data volume

Shantagiri

Kapur

Shastry

2021

IET Computers & Digital Tech

Self Cite

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“…It is claimed that it is able to reduce TAT with increased TDV. 2Broadcasting techniques with a mixture of both compression and scan mode: The hybrid approach, which is a combination of scan and compression to improve pattern count in the presence of unknowns in scan unload patterns, is proposed in [32]. This significantly reduces the pattern count.…”

Section: Broadcasting Based Techniquesmentioning

confidence: 99%

Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach

Shantagiri

Kapur

2019

JLPEA

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Scan-based structural testing methods have seen numerous inventions in scan compression techniques to reduce TDV (test data volume) and TAT (test application time). Compression techniques lead to test coverage (TC) loss and test patterns count (TPC) inflation when higher compression ratio is targeted. This happens because of the correlation issues introduced by these techniques. To overcome this issue, we propose a new hybrid scan compression technique, the aggressive exclusion (AE) of scan cells from compression for increasing overall TC and reduce TPC. This is achieved by excluding scan cells which contribute to 12% to 43% of overall care bits from compression architecture, placing them in multiple scan chains with dedicated scan-data-in and scan-data-out ports. The selection of scan cells to be excluded from the compression technique is done based on a detailed analysis of the last 95% of the patterns from a pattern set to reduce correlations. Results show improvements in TC of up to 1.33%, and reductions in TPC of up to 77.13%.

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Handling Unknown with Blend of Scan and Scan Compression

Cited by 2 publications

References 40 publications

New scan compression approach to reduce the test data volume

New scan compression approach to reduce the test data volume

Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach

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