2020
DOI: 10.35848/1347-4065/aba5e1
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Halide perovskite memtransistor enabled by ion migration

Abstract: We exploit the problem of ion migration in the halide perovskite CH3NH3PbI3 (MAPbI3) by developing a memtransistor (i.e. hybrid memristor and transistor) with the field-effect transistor geometry. Application of an electric field between the drain and the source results in resistive switching from a high resistance state (HRS) to a low resistance state (LRS) due to dynamic redistribution of ions in the MAPbI3 layer. The gate enables continuous tuning of this LRS across several orders of magnitude. The LRS pers… Show more

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Cited by 18 publications
(24 citation statements)
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References 49 publications
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“…The reason for this phenomenon may be the existence of KI promoted ion migration in the mixed film along the perovskite grain boundaries. [ 46,47 ]…”
Section: Resultsmentioning
confidence: 99%
“…The reason for this phenomenon may be the existence of KI promoted ion migration in the mixed film along the perovskite grain boundaries. [ 46,47 ]…”
Section: Resultsmentioning
confidence: 99%
“…This positive development is also accompanied by an overall improvement of device performance, illustrated by the gradual increase in mobility and the emergence of perovskite-based FETs with novel functionalities such as memory. [180,185] Still, many other challenges remain to be addressed, in particular, issues related to device stability, where significantly more research is required.…”
Section: Summary and Future Opportunitiesmentioning
confidence: 99%
“…Y, Cr, IZO, ITO and graphene represent promising alternatives as robust contact materials, where such reactions do not occur. [93,[141][142][143]149,152,178,180] A solution to the Au interface reactivity problem is treatment with a SAM or insertion of an interlayer. [65] In addition to acting as a physical barrier to electrochemical degradation, these chemical functionalizations allow for the tuning of the injection barrier at the semiconductor/contact interface and, in some cases, assist with improving the perovskite film microstructure by modifying the surface energy.…”
Section: Source-drain Electrodes Used In Perovskite Fetsmentioning
confidence: 99%
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