1963
DOI: 10.1016/0038-1101(63)90115-1
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Halbleiterbauelemente, vol. 1, semiconductors and semiconductor diodes

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Cited by 18 publications
(27 citation statements)
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“…1). A similar low energy peak has been observed for Ge-bicrystals by Matare [4]. It was interpreted in terms of the GB-induced deep defect traps, located within the energy gap.…”
Section: Resultssupporting
confidence: 79%
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“…1). A similar low energy peak has been observed for Ge-bicrystals by Matare [4]. It was interpreted in terms of the GB-induced deep defect traps, located within the energy gap.…”
Section: Resultssupporting
confidence: 79%
“…At T = 100 K they show typical back-to-back diode behavior caused by the presence of the GB potential well [4]. The near-zero resistance Β0 which, at a constant temperature, is the exponential function of the well depth was found to depend strongly on illumination.…”
Section: Resultsmentioning
confidence: 93%
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“…17 The authors of Ref. 16 suggested that the presence of decreasing dependencies R c ðTÞ proves that the thermionic mechanism of current flow is realized in the contact. They determined the barrier height (which turned out to be anomalously low) from the slope of the R c ð1=TÞ curve.…”
Section: Gaas Casementioning
confidence: 99%
“…The difference in the effect of the MPF on the PL and EL spectral properties is probably due to the large influence on the EL quantum yield in powders of innumerable internal boundaries such as dislocation boundaries that intensify radiative recombination in EL. It is known [23] that the EL intensity of ZnS reaches a maximum at sites of dislocations or dislocation pileups. However, the LES for λ = 505 nm in ZnS:CuCl (Fig.…”
Section: Introductionmentioning
confidence: 99%